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Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS

Published

Author(s)

Scott A. Wight, G Gillen, T M. Herne
Proceedings Title
Microscopy and Microanalysis
Conference Dates
February 13, 2009
Conference Location
xxxx
Conference Title
Microscopy and Microanalysis Proceedings

Citation

Wight, S. , Gillen, G. and Herne, T. (1997), Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS, Microscopy and Microanalysis, xxxx, -1 (Accessed June 14, 2024)

Issues

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Created December 1, 1997, Updated February 19, 2017