Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS

Published

Author(s)

Scott A. Wight, G Gillen, T M. Herne
Proceedings Title
Microscopy and Microanalysis
Conference Dates
February 13, 2009
Conference Location
xxxx
Conference Title
Microscopy and Microanalysis Proceedings

Citation

Wight, S. , Gillen, G. and Herne, T. (1997), Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS, Microscopy and Microanalysis, xxxx, -1 (Accessed December 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 1, 1997, Updated February 19, 2017