Gillen, J.
and Roberson, S.
(1998),
Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry, Rapid Communications in Mass Spectrometry
(Accessed December 5, 2024)
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Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry
Published
Author(s)
,
Citation
Rapid Communications in Mass Spectrometry
Volume
12
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1998, Updated February 19, 2017