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Displaying 926 - 940 of 940

UV Photopatterning of Alkanethiolate Monolayers Self-Assembled on Gold and Silver

June 1, 1993

Author(s)

Michael J. Tarlov, Donald R. Burgess Jr., J Greg Gillen

Doped Gelatin Films as a Model Matrix for Molecular Secondary Ion Mass-Spectrometry Studies of Biological Soft-Tissue

January 1, 1993

Author(s)

John G. Gillen, S.M. Hues

Environmental Scanning Electron Microscope Imaging Examples Related to Particle Analysis

January 1, 1993

Author(s)

Scott Wight, Cynthia J. Zeissler

Formation and Emission of Tetraalkylammonium Salt Molecular-Ions Sputtered from a Gelatin Matrix

January 1, 1993

Author(s)

John G. Gillen, J. Bennett

High Dynamic Range SIMS Depth Profiling on In Situ Ion-beam-generated Mesas Using the Ion Microscope

July 1, 1992

Author(s)

John G. Gillen

Localization of Labeled Compounds in Human Hair Using SIMS

June 5, 1992

Author(s)

John G. Gillen, Cynthia J. Zeissler

Imaging with Bubble Detectors

January 1, 1992

Author(s)

Cynthia J. Zeissler

The Use of Kinetic-Engergy Distributions to Determine the Relative Contributions of Gas-Phase and Surface Fragmentation in Kiloelectronvolt Ion Sputtering of an Quaternary Ammonium Salt

April 15, 1991

Author(s)

John G. Gillen

Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors

January 1, 1991

Author(s)

John G. Gillen, Debra L. Kaiser, Jay S. Wallace

Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds

January 1, 1990

Author(s)

John G. Gillen, David S. Simons, P. Williams

An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynuclear

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989

Author(s)

John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues

Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion depth

Characterization of SRM 1866 Using Spindle Stage Techniques

November 21, 1988

Author(s)

Jennifer R. Verkouteren, J M. Phelps, Cynthia J. Zeissler, Eric B. Steel

SRM 8411: Report of Investigation, Research Material 8411 Mixed Asbestos Research Fiber

November 18, 1988

Author(s)

Eric B. Steel, J. J. Sheridan, Cynthia J. Zeissler

Nanoparticle Release from Polymer Nanocomposites Used for Potable Water Infrastructure and Food Packaging: Current Progress & Beyond

Author(s)

Andrew Whelton, T.V. Duncan , J.L. Koontz , Tinh Nguyen

Nanoparticle (NP) enhanced polymers have the potential to revolutionize food packaging and water pipe performance, though release from these materials has gone relatively unstudied. A literature review was conducted to identify potential NP release

Peptide-Directed PdAu Nanoscale Surface Segregation: Toward Controlled Bimetallic Architecture for Catalytic Materials

Author(s)

Nicholas M. Bedford, Allison R. Showalter, Taylor J. Woehl, Zak E. Hughes, Sungsik Lee, Benjamin Reinhart, S. P. Ertem, E. B. Coughlin, Yang Ren, Bruce A. Bunker

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