Simons, D.
, Chi, P.
, Downing, R.
and Lamaze, G.
(1995),
The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry, AIP Press, Woodbury, NY
(Accessed December 8, 2024)
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The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
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Semiconductor Characterization Present Status and Future Needs
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AIP Press, Woodbury, NY
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Books
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Created December 1, 1995, Updated February 19, 2017