Gillen, J.
, Kaiser, D.
and Wallace, J.
(1991),
Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors, Surface and Interface Analysis
(Accessed September 20, 2024)
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Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Published
Author(s)
, Debra L. Kaiser, Jay S. Wallace
Citation
Surface and Interface Analysis
Volume
17
Issue
1
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1991, Updated February 19, 2017