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Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Gillen, J.
, Kaiser, D.
and Wallace, J.
(1991),
Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors, Surface and Interface Analysis
(Accessed October 18, 2025)