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PUBLICATIONS

Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors

Published

Author(s)

John G. Gillen, Debra L. Kaiser, Jay S. Wallace
Citation
Surface and Interface Analysis
Volume
17
Issue
1
Pub Type
Journals
Chemistry and Nanotechnology

Citation

Gillen, J. , Kaiser, D. and Wallace, J. (1991), Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors, Surface and Interface Analysis (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1991, Updated February 19, 2017
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