Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors

Published: January 01, 1991

Author(s)

John G. Gillen, Debra L. Kaiser, Jay S. Wallace
Citation: Surface and Interface Analysis
Volume: 17
Issue: 1
Pub Type: Journals
Created January 01, 1991, Updated February 19, 2017