@article{103311,
  author = {John Gillen and Debra Kaiser and Jay Wallace},
  title = {Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors},
  year = {1991},
  number = {17},
  month = {1991-01-01},
  publisher = {Surface and Interface Analysis},
  language = {en},
}