TY  - JOUR
AU  - John Gillen
AU  - Debra Kaiser
AU  - Jay Wallace
C2  - Surface and Interface Analysis
DA  - 1991-01-01
LA  - en
M1  - 17
PB  - Surface and Interface Analysis
PY  - 1991
TI  - Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
ER  -