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Metrology

Electrical / electromagnetic metrology

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Displaying 326 - 350 of 458

Evaluation of High-Voltage Impulse Waveforms Using Model-Based Deconvolution

June 1, 1998
Author(s)
Gerald FitzPatrick, Eric D. Simmon, J. Lagnese
Accurate measurement of high voltage (hv) impulse waveforms is of critical importance in the testing of hv apparatus and for fundamental insulation studies. Quantifying the measurement system errors can be performed by following procedures recommended by

NIST Measurement Assurance Program for Resistance

November 1, 1997
Author(s)
Paul A. Boynton, June E. Sims, Ronald F. Dziuba
The National Institute of Standards and Technology (NIST) offers resistance Measurement Assurance Program (MAP) transfers at the 1 ohm and 10 k ohm levels, to provide a method of assessing and maintaining the quality of a customer's measurement process

Modulation of the Charge of a Single-Electron Transistor by Distant Defects

September 1, 1997
Author(s)
Neil M. Zimmerman, J. L. Cobb, Alan F. Clark
We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of intermediate states, we conclude that there is a cluster of triggered TLF's in this case. The

Noise-Temperature Measurement System for the WR-28 Band

August 1, 1997
Author(s)
James P. Randa, L. A. Terrell
The NIST Noise Project has constructed and tested a radiometer for the measurement of noise sources in the WR-28 waveguide band (26.5 GHz to 40 GHz). It is a total-power radiometer which incorporates a six-port reflectometer for the measurement of relevant
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