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PUBLICATIONS

Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor

Published

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, John Q. Shields, Lai H. Lee, Marvin E. Cage, Scott H. Shields, Ronald F. Dziuba
Citation
Metrologia
Issue
2
Pub Type
Journals

Download Paper

Local Download
Electrical / electromagnetic metrology

Citation

Jeffery, A. , Elmquist, R. , Shields, J. , Lee, L. , Cage, M. , Shields, S. and Dziuba, R. (1998), Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3449 (Accessed October 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 31, 1998, Updated October 12, 2021
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