Jeffery, A.
, Elmquist, R.
, Shields, J.
, Lee, L.
, Cage, M.
, Shields, S.
and Dziuba, R.
(1998),
Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3449
(Accessed October 8, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor
Published
Author(s)
, , , , , , Ronald F. Dziuba
Citation
Metrologia
Issue
2
Pub Type
Journals
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1998, Updated October 12, 2021