@article{759851,
  author = {Anne-Marie Jeffery and Randolph Elmquist and John Shields and Lai Lee and Marvin Cage and Scott Shields and Ronald Dziuba},
  title = {Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor},
  year = {1998},
  month = {1998-06-01 00:06:00},
  publisher = {Metrologia},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3449},
  language = {en},
}