Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance

Published

Author(s)

Marvin E. Cage, Anne-Marie Jeffery, Randolph Elmquist

Abstract

We find from equivalent circuit calculations that a single ac ratio bridge could be used to measure the ac quantized Hall resistance and to also provide independent values of the ac longitudinal resistance in a quantum Hall effect device by making quantized Hall resistance measurements for two different combinations of triple-series connections to the device.
Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
July 6-10, 1998
Conference Location
Washington, DC

Keywords

ac quantum Hall effect, equivalent electrical circuit, longitudinal resistance, multi-series connections, quantized Hall resistance

Citation

Cage, M. , Jeffery, A. and Elmquist, R. (1998), Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29591 (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 1998, Updated October 12, 2021