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Metrology

Electrical/electromagnetic metrology

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Displaying 351 - 375 of 474

Modulation of the Charge of a Single-Electron Transistor by Distant Defects

September 1, 1997
Author(s)
Neil M. Zimmerman, J. L. Cobb, Alan F. Clark
We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of intermediate states, we conclude that there is a cluster of triggered TLF's in this case. The

Noise-Temperature Measurement System for the WR-28 Band

August 1, 1997
Author(s)
James P. Randa, L. A. Terrell
The NIST Noise Project has constructed and tested a radiometer for the measurement of noise sources in the WR-28 waveguide band (26.5 GHz to 40 GHz). It is a total-power radiometer which incorporates a six-port reflectometer for the measurement of relevant

The NIST Electronic Kilogram

January 1, 1997
Author(s)
David B. Newell, K Fujii, Andrew Gillespie, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams
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