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Metrology

Electrical / electromagnetic metrology

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Displaying 351 - 375 of 459

NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor

April 1, 1997

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Lai H. Lee, John Q. Shields, Ronald F. Dziuba

Recent Results and Future Challenges for the NIST Charged-Capacitor Experiment

April 1, 1997

Author(s)

Neil M. Zimmerman, J. L. Cobb, Alan F. Clark

The NIST Watt Balance: Progress Toward Monitoring the Kilogram

April 1, 1997

Author(s)

Richard L. Steiner, Andrew Gillespie, K Fujii, Edwin R. Williams, David B. Newell, Alain Picard, Gerard N. Stenbakken, P. T. Olsen

Extension of the NIST AC-DC Difference Calibration Service for Current to 100 kHz

January 1, 1997

Author(s)

Joseph R. Kinard Jr., Thomas E. Lipe Jr., Clifton B. Childers

The NIST Electronic Kilogram

January 1, 1997

Author(s)

David B. Newell, K Fujii, Andrew Gillespie, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams

Intrinsic Capacitances and Inductances of Quantum Hall Effect Devices

November 1, 1996

Author(s)

Marvin E. Cage, Anne-Marie Jeffery

Comparative High Voltage Impulse Measurements

September 1, 1996

Author(s)

Gerald FitzPatrick, Edward F. Kelley

A 7-Junction Electron Pump: Design and Operation

June 1, 1996

Author(s)

Mark W. Keller, John M. Martinis, Neil M. Zimmerman

A Low Thermal Guarded Scanner for High Resistance Measurement Systems

June 1, 1996

Author(s)

J. A. Marshall, T. A. Marshall, Dean G. Jarrett, Ronald F. Dziuba

A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer

June 1, 1996

Author(s)

K Fujii, Edwin R. Williams, Richard L. Steiner

An Active High Voltage Divider with 20-PPM Uncertainty

June 1, 1996

Author(s)

O. Petersons, Eric D. Simmon, Gerald FitzPatrick

Exploring the Low Frequency Performance of Thermal Converters Using Circuit Models and a Digitally Synthesized Source

June 1, 1996

Author(s)

Nile M. Oldham, Mark E. Parker, Barry A. Bell, S. Avramov

High-Current Thin Film Multijunction Thermal Converters and Multi-Converter Modules

June 1, 1996

Author(s)

Joseph R. Kinard Jr., Thomas E. Lipe Jr., Clifton B. Childers, Donald B. Novotny, D. X. Huang

Loading Effects in Resistance Scaling

June 1, 1996

Author(s)

Randolph Elmquist, Ronald F. Dziuba

Low Voltage Standards in the 10 Hz to 1 MHz Range

June 1, 1996

Author(s)

Nile M. Oldham, Mark E. Parker, Bryan C. Waltrip, S. Avramov

Measurement and Reduction of Alignment Errors of the NIST Watt Experiment

June 1, 1996

Author(s)

Andrew Gillespie, K Fujii, David B. Newell, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams

NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor

June 1, 1996

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Lai H. Lee, John Q. Shields, Ronald F. Dziuba

Proposed Tests to Evaluate the Frequency-Dependent Capacitor Ratio for Single Electron Tunneling Experiment

June 1, 1996

Author(s)

S. Avramov, Neil M. Zimmerman, Alan F. Clark, Anne-Marie Jeffery

Results of Capacitance Ratio Measurements for the Single Electron Pump-Capacitor Charging Experiment

June 1, 1996

Author(s)

Neil M. Zimmerman, Alan F. Clark, Edwin R. Williams

The NIST Watt Balance: Progress Toward Monitoring the Kilogram

June 1, 1996

Author(s)

Richard L. Steiner, Andrew Gillespie, K Fujii, Edwin R. Williams, David B. Newell, Alain Picard, Gerard N. Stenbakken, P. T. Olsen

Transient Errors in a Precision Resistive Divider

June 1, 1996

Author(s)

S. A. Boggs, Gerald FitzPatrick, J. Kuang

The NIST Watt Experiment: Monitoring the Kilogram

March 1, 1996

Author(s)

Andrew Gillespie

Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections

November 1, 1995

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Marvin E. Cage

Potential and Current Distributions Calculated Across a Quantum Hall Effect Sample at Low and High Currents

September 1, 1995

Author(s)

Marvin E. Cage, C. F. Lavine

Automated Resistance Measurements at NIST

July 1, 1995

Author(s)

Ronald F. Dziuba

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