Jeffery, A.
, Elmquist, R.
, Lee, L.
, Shields, J.
and Dziuba, R.
(1997),
NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15247
(Accessed December 4, 2024)
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NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor
Published
Author(s)
, , , , Ronald F. Dziuba
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
46
Issue
2
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 1997, Updated October 12, 2021