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NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor

Published

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Lai H. Lee, John Q. Shields, Ronald F. Dziuba
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
46
Issue
2

Citation

Jeffery, A. , Elmquist, R. , Lee, L. , Shields, J. and Dziuba, R. (1997), NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15247 (Accessed July 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 31, 1997, Updated October 12, 2021