Fujii, K.
, Williams, E.
and Steiner, R.
(1996),
A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Braunschweig, 1, GM, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=9148
(Accessed October 5, 2024)
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A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer
Published
Author(s)
K Fujii, ,
Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
June 17-20, 1999
Conference Location
Braunschweig, 1, GM
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1996, Updated October 12, 2021