Dziuba, R.
, Jarrett, D.
, Scott, L.
and Secula, A.
(1998),
Fabrication of High-Value Standard Resistors, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13355
(Accessed April 19, 2024)
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Fabrication of High-Value Standard Resistors
Published
Author(s)
Ronald F. Dziuba, , L. L. Scott,
Abstract
The National Institute of Standards and Technology (NIST) has fabricated stable, transportable 10 MΩ} and 1 GΩ} standard resistors for use in an international comparison of high resistances. This fabrication process is being applied to the construction of standard resistors of values up to 10 TΩ}, with initial results indicating significant improvements in stability and fewer adverse effects induced by mechanical shock and vibration.Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Volume
48
Issue
2
Conference Dates
July 6-10, 1998
Conference Location
Washington, DC
Pub Type
Conferences
Download Paper
Keywords
electrical resistance, resistors, standard resistors, thin-film resistors, wirewound resistors
Citation
Created June 30, 1998, Updated October 12, 2021