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Manufacturing

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Displaying 1251 - 1275 of 2179

Reasoning in Manufacturing Part-Part Examples with OWL 2

October 29, 2008
Author(s)
Nenad Krdzavac, Conrad E. Bock
This report examines whether the Web Ontology Language 2 (OWL 2) is expressive enough for some common manufacturing examples involving relations between parts of composite or assembled objects (part-part relations). We specify the semantics of these

A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE

October 19, 2008
Author(s)
Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A. Kramar
A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision instrumentation applications, such as scanning probe microscopy (SPM). In this article, we describe the

Error Motions of a Non-orthogonal Rotary Axis

October 19, 2008
Author(s)
Michael L. McGlauflin, Shawn P. Moylan
Error-motions of rotating axes are one of many sources of imprecision in machining. Accurate determination of axis of rotation error motions of the rotary axes has a direct influence on the accuracy of the finished part. International and U.S. national

International photomask linewidth comparison by NIST and PTB

October 17, 2008
Author(s)
James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Egbert Buhr, Bernd Bodermann, Wolfgang Hassler-Grohne, Harald Bosse, C.G. Frase
In preparation of the international Nano1 linewidth comparison on photomasks between 8 national metrology institutes, NIST and PTB have started a bilateral linewidth comparison in 2008, independent of and prior to the Nano1 comparison in order to test the

Towards Information Networks to Support Composable Manufacturing

October 15, 2008
Author(s)
Mahesh Mani, Albert W. Jones, Jun H. Shin, Ram D. Sriram
Rigid, supply-chain organizational structures are giving way to highly dynamic collaborative partnerships. These partnerships will develop rapidly by composing global manufacturing resources in response to open market opportunities; and, they will disband

Tradeoffs in Building a Generic Supply Chain Simulation Capability

October 15, 2008
Author(s)
Sanjay Jain
Building a simulation model for any large complex sys-tem requires high expertise and effort. These requirements can be reduced through building generic simulation capability that includes artifacts for facilitating the development of the simulation model

Contactless Differential Conductivity Detection

October 12, 2008
Author(s)
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis

October 1, 2008
Author(s)
Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne
Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the

Using uncalibrated lasers as wavelength standards

October 1, 2008
Author(s)
Jack A. Stone Jr.
The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary from its central value by more than a few parts in 106. The uncertainty of the gas laser

Performance Evaluation of Laser Trackers

September 15, 2008
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
The American Society for Mechanical Engineers (ASME) recently released the ASME B89.4.19 Standard [1] on performance evaluation of spherical coordinate instruments such as laser trackers. At the National Institute of Standards and Technology (NIST), we can

Accuracy Considerations for Critical Dimension Semiconductor Metrology

September 9, 2008
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, B Bunday, J Allgair
As the size of integrated circuit features continues to decrease, the accuracy of measurements becomes more important. Due to greater emphasis on precision rather than accuracy, many of the measurements made in semiconductor fabs are not traceable to the

NIST Microform Calibration System for Rockwell Hardness Standardization

August 25, 2008
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell hardness tests, microform geometric errors of the diamond indenter are a major contributor. The microform calibration of Rockwell diamond indenters has been one of the key steps for Rockwell hardness standardization

Performance of Super-Resolution Enhancement for Flash LADAR Data

August 21, 2008
Author(s)
Tsai Hong Hong, Shuowen Hu, S. S. Young
Flash laser detection and ranging (LADAR) systems are increasingly used in robotics applications for autonomous navigation and obstacle avoidance. Their compact size, high frame rate, wide field of view, and low cost are key advantages over traditional

Cellulose Nanocrystals the Next Big Nano-thing?

August 6, 2008
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H. Wegner
Biomass surrounds us from the smallest alga to the largest redwood tree. Even the largest trees owe their strength to a newly-appreciated class of nanomaterials known as cellulose nanocrystals (CNC). Cellulose, the world s most abundant natural, renewable

Metrology at the Nanoscale: What are the Grand Challenges?

August 6, 2008
Author(s)
Kevin W. Lyons, Michael T. Postek
Nanometrology provides the means to measure and characterize nanometer scale process and product performance and covers an expanse of topics including instrumentation, measurement methods (off-line and in-process applications), and standards. To meet the

Natural Gas Flow Calibration Service

August 1, 2008
Author(s)
Aaron N. Johnson
This document describes NIST's high pressure natural gas flow calibration service (NGFCS). Flow calibrations are conducted offsite at the Colorado Experimental Engineering Station Incorporated (CEESI) in Garner, Iowa. A parallel array of nine turbine meter

Simulated SEM Images for Resolution Measurement

July 30, 2008
Author(s)
Petr Cizmar, Andras Vladar, Bin Ming, Michael T. Postek
Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special ''resolution'' samples and there are several
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