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2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

Published

Author(s)

Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters

Abstract

A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National workshop on Standards for Nanotechnology was hosted by NRC in Ottawa. NIST was pleased to continue this new momentum by hosting the second workshop in this series on February 6, 2008 at the NIST Gaithersburg campus. A full day of presentations covered the state of nanotechnology in all three North American nations, the limits of current technology and standards both documentary and physical. One major goal of this workshop was to increase the mutual awareness and cooperation among North American delegates to international standards bodies.
Citation
Tri-national Workshop on Standards for Nanotechnolgoy

Keywords

Nanotechnology, standards, SDO, documentary standards, ISO, metrology, particle size, CNT

Citation

Dixson, R. , Pratt, J. , Hackley, V. , Potzick, J. , Allen, R. , Orji, N. , Postek, M. , Bennett, H. , Vorburger, T. , Fagan, J. and Watters, R. (2008), 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations), Tri-national Workshop on Standards for Nanotechnolgoy, [online], http://www.mel.nist.gov/trinat.htm (Accessed July 21, 2024)

Issues

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Created December 10, 2008, Updated February 19, 2017