NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electronics

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 176 - 200 of 690

Surface conductance of graphene from non-contact resonant cavity

March 15, 2016
Author(s)
Jan Obrzut, Caglar Dogu Emiroglu, Oleg A. Kirillov, Yanfei Yang, Randolph E. Elmquist
A method is established to reliably determine surface conductance of single-layer or multi-layer atomically thin nano-carbon graphene structures. These can be synthesized by chemical vapor deposition (CVD), epitaxial growth on silicon carbide (SiC)

The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers

February 25, 2016
Author(s)
Lee J. Richter, Hyunbok Lee, Christopher McNeil, Eliot Gann, Lars Thomsen, S. Park, J. Jeong, Z. A. Page, Egle Puodziukynaite, Todd Emrick, Alejandro Briseno, John C. Stephenson, Dean M. DeLongchamp
Market demand for ubiquitous, increased functionality products at low cost (the internet of things) is spurring development in additive, solution processing of electronic devices. Performance in thin-film functional devices, be they transistors, diodes, or

Absorption Cross Section Measurements of a Human Body in a Reverberation Chamber

February 8, 2016
Author(s)
Damir Senic, Antonio Sarolic, Zbigniew M. Joskiewicz, Christopher L. Holloway
We provide the results of human body absorption cross section (ACS) measurements. The setup was based on the reverberation chamber as a well-known measurement environment capable of performing ACS measurements. The approach was supported by reference

Large-Signal-Network-Analyzer Round Robin

February 1, 2016
Author(s)
Dylan F. Williams, Paul D. Hale, Catherine A. Remley, Gustavo Avolio, Dominique Schreurs, Diogo C. Ribeiro, Pawel Barmuta, Gian Piero Gibiino, Mohammad Rajabi, Arkadiusz Lewandowski, Jaros?aw Szatkowski, Kuangda Wang
This paper describes tests of the calibration-comparison method as an approach to assessing the measurement accuracy of large-signal network analyzer calibrations. We show that having one trusted reference calibration allows the calibration accuracy of the

A Simulation Study of the LTE Interference on WiFi Signal Detection

January 6, 2016
Author(s)
Yao Ma, Daniel G. Kuester, Jason B. Coder, William F. Young
To address the spectrum scarcity problem and enhance spectrum utilization efficiency, spectrum sharing and coexistence of different wireless communication systems are important ongoing research topics. Unlicensed use of the ISM band by the long-term

Spectrum Sensing with WLAN Access Points

January 5, 2016
Author(s)
Jason Coder, Ryan T. Jacobs, Vivian Musser
With wireless communication becoming more and more common in simple everyday devices, the available spectrum is quickly filling up and the risk of interference is increasing. This interference could be a slight nuisance to or it could be a more significant

Broadband Optical Properties of Graphene by Spectroscopic Ellipsometry

December 11, 2015
Author(s)
Wei Li, Nhan Van Nguyen, Guangjun Cheng, Angela R. Hight Walker, David J. Gundlach, Yiran Liang, boyuan Tian, Xuelei Liang, Lian-Mao Peng
The broadband (0.7 eV to 9.0 eV) optical properties of chemical-vapor-deposition (CVD) grown graphene are determined by spectroscopic ellipsometry. The optical absorption follows the fine structure constant in the energy range from 1.0 eV to 2.0 eV, but

Quantized Hall resistance in large-scale monolayer graphene

November 28, 2015
Author(s)
Yanfei Yang, Chiashain Chuang, Chieh W. Liu, Randolph Elmquist
Abstract: Graphene is an atomic-thickness carbon lattice that can be exfoliated from solid graphite or grown using high temperature processing methods on a variety of substrates. Many practical applications of large-area graphene, however, are limited by

Designing a Cyber-Physical Cloud Computing Architecture

June 2, 2015
Author(s)
Eric D. Simmon, Sulayman Sowe, Koji Zettsu
In this era of inter-connectivity where almost everybody, everything, and anything are networked, Cyber-Physical Systems (CPS) also known as the Internet of Things (IoT) have emerged as vital systems that use information systems to observe and modify the

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

June 1, 2015
Author(s)
Gustavo Avolio, Antonio Raffo, Jeffrey Jargon, Dominique Schreurs, Dylan Williams
This work focuses on the accuracy of nonlinear de-embedding applied to microwave transistor time-domain waveforms. The waveforms are acquired with a mixer-based Large-Signal Network Analyzer (LSNA) and are corrected at the transistor's reference planes by

Higher order perpendicular magnetic anisotropy in ultra-thin Co60Fe20B20 layers and the observation of an easy cone state.

June 1, 2015
Author(s)
Justin M. Shaw, Hans T. Nembach, Mathias A. Weiler, Martin A. Schoen, Thomas J. Silva, Jonathan Z. Sun, Daniel C. Worledge
We used broadband ferromagnetic resonance (FMR) spectroscopy to measure the second and forth order perpendicular magnetic anisotropies in Ta/ Co60Fe20B20/MgO layers over a thickness range of 0.8-5 nm. For a thickness greater than 1.0 nm, the easy axis is

Experimentally, How Does Cu TSV Diameter Influence its Stress State?

May 27, 2015
Author(s)
Chukwudi A. Okoro, Lyle E. Levine, Yaw S. Obeng, Ruqing Xu
In this work, an experimental study of the influence of Cu through-silicon via (TSV) diameter on stress build up was performed using synchrotron-based X-ray microdiffraction technique. Three Cu TSV diameters were studied; 3 µm, 5 µm and 8 µm, all of which

Rectangular-Waveguide Impedance

May 22, 2015
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Uwe Arz, Paul D. Hale
We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We also

Electro-thermal Simulation of 1200 V 4H-SiC MOSFET Short-Circuit SOA

May 10, 2015
Author(s)
Tam H. Duong, Jose M. Ortiz, David W. Berning, Allen R. Hefner Jr., Sei-Hyung Ryu, John W. Palmour
The purpose of this paper is to introduce a dynamic electro-thermal simulation and analysis approach for device design and short-circuit safe-operating-area (SOA) characterization using a physics-based electro-thermal Saber®* model. Model parameter

Beam broadening in transmission EBSD

March 16, 2015
Author(s)
Robert R. Keller, Katherine P. Rice, Mark Stoykovich
Transmission electron backscatter diffraction (t-EBSD), also known as transmission electron forward scatter diffraction (t-EFSD) or transmission Kikuchi diffraction in the SEM (TKD-SEM), can provide significant improvements in spatial resolution over

Widebend CTL cell to measure operating range of UHF RFID

March 5, 2015
Author(s)
Jehoon Yun, YongChae Jeong, David R. Novotny, Jeffrey R. Guerrieri
A wideband coupled transmission line (CTL) cell to measure the operating range of an UHF RFID (ORUR) is presented. Also, an ORUR test system is proposed to increase the isolation to more than 55 dB. It is shown that the ORUR measured by this proposed cell
Was this page helpful?