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Scratch damage modes in zirconia-based ceramics, Mg-PSZ, T-TZP and Ce-TZP are investigated. Precursor indentation tests with a tungsten carbide sphere foreshadow the nature of damage: in Mg-PSZ - extensive quasi-plastic deformation in the region outside
Andrew J. Allen, Lin-Sien H. Lum, K T. Faber, M H. Zimmerman, Jay S. Wallace
This paper discusses how small-angle neutron scattering studies can be applied in two variations to obtain a representative characterization of the large, densely-populated, and anisotropic features that occur in the microstructures of various materials
The three omega thermal conductivity measurement method is analyzed for the case of one or more thin films on a substrate of finite thickness. The analysis is used to obtain the thermal conductivities of SiO 2 films on Si substrates and of a chemical vapor
The Ceramic Processing Characterization Consortium (CPCC) held its semi annual meeting in Indianapolis on April 25, 1999. The meeting was attended by over 60 members of the consortium. The meeting was opened by Steve Freiman, who introduced Said Jahnmir as
Chemically assisted machining of ceramics is a way to remove ceramic materials rapidly using chemical reactions at the interface between the tool and the workpiece. Two effects are observed: chemical reactions that react with he workpiece forming an easily
Wafers from mercuric iodide crystals grown in microgravity on two occasions have previously been found to be characterized by a higher hole mobility-lifetime produce, which enables energy dispersive radiation detectors with superior resolution. In the
C A. Parker, J C. Roberts, S M. Bedair, M J. Reed, S X. Liu, N A. El-Masry, Larry Robins
Band gap measurements have been carried out in strained and relaxed In xGa 1-xN epilayers with x > 0.25. Values of x were determined from x-ray diffraction (XRD) of relaxed films. Band gaps measured by both Photoluminenscence (PL) and optical transmission
X-ray photoelectron spectroscopy (XPS) was used to analyze samples of a commercial clay powder and a kaolin standard. Samples were analyzed both in the as-received condition and after heating to temperatures > or = to} 750 degrees C. There was a loss of
J A. Salem, L -. Ghosn, M G. Jenkins, George D. Quinn
The Chevon notch test method was analyzed to determine whether straight through crack assumption or slice models fitted finite elements better. New polynomial expressions for the stress intensity shape factor Y were devised for the four specimen/fixture
State-of-the-art models available for predicting the characteristics of diamond-ground surfaces entail digitization of wheel topography which limits their practical utility. This paper presents a geometric simulation of surface generation in diamond
The in-plane thermal diffusivity of chemical-vapor-deposited diamond films was measured as a function of diamond-growth rate. The films, 0.1-0.4 mm thick, were prepared in microwave-plasma reactor at growht rates ranging from 1 to 10 m/h. A modification of
A S. Von Gonten, James F. Kelly, Joseph M. Antonucci
lcium phosphate cements (CPC) have proven successful in the repair of small, non-stress bearing skeletal defects. These cements do not have sufficient tensile strength or fracture toughness to allow their use in stress-bearing applications. It was
Igor Levin, Richard D. Leapman, Debra L. Kaiser, P C. van Buskirk, R Bilodeau, R Carl
The microstructure and chemistry of a Ti-rich (Ba,Sr)TiO 3 film with 53.4 % Ti deposited on Pt/SiO 2/Si substrate by MOCVD was studied using high-resolution transmission electron microscopy and elemental mapping in electron energy loss spectroscopy. We
An extensive collection of fracture toughness (KIc) and strength ( f) data for brittle materials has been used to examine the relation between the mean measured values of KIc and f. The two properties have been found to have a weak, but useful, empirical
A micro-mechanic blister growth model is proposed for a coating system consisting of a polymer film applied to a steel substrate exposed to salt solutions. The mechanism of the blister formation is based on corrosion-induced disbondment of the coating at
The amorphous state of bisphenol-A polycarbonate was examined by time-domain dielectric spectroscopy as a function of crystallization time over a frequency range of 1 x 10 -4 Hz to 1 x 10 4 Hz. The dielectric measurements were performed in the temperature
The NIST WWW High Temperature Superconducting Materials Database (WebHTS version 2.0) provides evaulated thermal, mechanical, and superconducting property data for oxide superconductors. The range of materials covers the major series of compoundsderived
The Versailles Advanced Materials and Standards VAMAS project is a forum for prestandardization research. It has helped spread awareness of new testing and characterization methods around the world. Technical Working Area (TWA) 3-Ceramics has been active
Bruce D. Ravel, Charles E. Bouldin, H Renevier, J -. Hodeau, J -. Berar
When two or more absorption edges in a material are sufficiently close in energy, Extended X-ray-Absorption Fine-Structure (EXAFS) spectroscopy may be of limited utility as the usable data range above the lower energy edge is truncated by the presence of
A new Standard Reference Material (SRM) has been prepared for ceramic fracture toughness. It is the first reference material in the world for the property fracture toughness for any class material (metal, ceramic, polymer). The SRM may be used with any
A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A θ - 2θscan of a Bragg peak from the textured planes is collected and also a θ scan, or rocking curve, using the same
To enhance thermal efficiency of a system in high temperature structural applications, thermal barrier coatings (TBC) are often applied on the metallic substrate to protect the component from deterioration while increasing the operating temperature of the
An alternative method of analysis was developed to estimate characteristic parameters of a published grain-bridging model for crack-extension resistance (R-curve) and to enable estimations of standard deviations of the perameters, which determine to a
Failure of thin-film interconnects poses a great concern in semiconductor devices. Due to the high electric current density in interconnects, electromigration-induced atomic flux is recognized as an important failure mechanisms. For wide polycrystalline
An earlier paper co-authored by the present author contains a major assumption in the analytical method that not be valid in a general class of structural ceramics. A more-rigorous mathematical analysis without this assumption has been performed, and the