Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 1651 - 1675 of 1729

Bond Lengths in Strained Semiconductor Alloys

May 1, 1999
Author(s)
Joseph C. Woicik
The bond lengths in a series of strained, buried Ga1-xInxAs thin-alloy films grown coherently on GaAs(001) and InP(001) substrates have been determined by high-resolution extended x-ray absorption fine-structure and diffraction anomalous fine-structure

Generation of Different UHMWPE Particle Shape by Wear Through Surface Texturing

April 1, 1999
Author(s)
H. W. Fang, M C. Shen, U Cho, John A. Tesk, A Christou, Stephen M. Hsu
Ultra-high molecular weight polyethylene (UHMWPE) wear particles in replaced joints have been linked to biochemical reactions that eventually lead to loosening of prosthesis. Several studies have shown that UHMWPE produces a wide range of particle sizes

Microstructural Changes in YSZ Deposits During Annealing

March 1, 1999
Author(s)
Andrew J. Allen, J Ilavsky, Gabrielle G. Long, Jay S. Wallace, C C. Berndt, H Herman
Various methods have been applied to the microstructural characterization of thermally-sprayed depostis. However, coexisting anisotropic distributions of intra-splat cracks and interlamellar pores, and the broad size range of rounded globular pores, have

VAMAS Technical Working Area #3

March 1, 1999
Author(s)
George D. Quinn, E F. Begley
Technical Working Area #3, Ceramics of the Versailles Advanced Materials and Standards (VAMAS) project has conducted 12 projects and 12,000 experiments over 12 years. This website explains TWA3, and lists the key accomplishments and publications from the

Barium Hollandite-Type Compounds Ba x Fe 2x Ti 8-2x O 16 with x= 1.143 and 1.333

February 23, 1999
Author(s)
J. M. Loezos, Terrell A. Vanderah, A R. Drews
Experimental X-ray powder diffraction patterns and refined unit cell parameters for two barium hollandite-type compounds. Ba xFe 2xTi 8-2xO 16, with x = 1.143 and 1.333, are reported here. Compared to the tetragonal parent structure, both compounds exhibit

The Use of Cyclic Phosphazene Additives to Enhance the Performance of the Head/Disk Interface

January 29, 1999
Author(s)
H J. Kang, Q Zhao, F E. Talke, D J. Perettie, B M. DeKoven, T A. Morgan, Daniel A. Fischer, Stephen M. Hsu, C S. Bhatia
Phase separation of phosphazene additives in perfluoropolyalkylether (PFPAE) lubricants is investigated as a function of additive concentration and lubricant layer thickness. The tribological behavior of various phosphazene additive/lubricant mixtures is

Ceramics 1998 Programs and Accomplishments

January 1, 1999
Author(s)
Stephen W. Freiman
The mission of the Ceramics Division can be stated as follows:Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the Nation's measurements and standards infrastructure for ceramic materials.The

Comparison of Classical and MALDI-TOF-MS Analysis of a Polystyrene Interlaboratory Sample

January 1, 1999
Author(s)
William R. Blair, B M. Fanconi, R J. Goldschmidt, Charles M. Guttman, William E. Wallace, S Wetzel, David L. VanderHart
Over the past several years, the use of MALDI-TOF-MS for analysis of synthetic polymers has increased significantly. As the number of polymer analyses by MALDI has increased, scrutiny of the MALDI results in comparison to classically derived values for Mw
Was this page helpful?