Microstructural Changes in YSZ Deposits During Annealing

Published

March 1, 1999

Author(s)

Andrew J. Allen, J Ilavsky, Gabrielle G. Long, Jay S. Wallace, C C. Berndt, H Herman

Abstract

Various methods have been applied to the microstructural characterization of thermally-sprayed depostis. However, coexisting anisotropic distributions of intra-splat cracks and interlamellar pores, and the broad size range of rounded globular pores, have limited the applicability of techniques such as image analysis or mercury intrusion porosimetry. By exploiting the symmetry of the microstructure about the spray direction, the small-angle neutron scattering (SANS) technique of Porod scattering has proven capable of determining the apparent surface area orientation distributions of the two anisotropic void -systems.In the research reported here, we describe the technique of anisotropic multiple small-angle neutron scattering (MSANS). Anisotropic MSANS, when combined with anisotropic Porod scattering, electron microscopy, and measurements of elastic modulus and density, has made possible the determination of the porosities, surface areas, mean opening dimensions, mean diameters, and approximate orientation distributions, of the intra-splat cracks and interlamellar pores, as well as the porosity, surface area, and mean diameter, of the globular pores. The changes in these parameters, as a function of annealing, have been studied.

Proceedings Title

Procedings of United Thermal Spray Conference '99 (UTSC '99)

Volume

17

Issue

No. 19

Conference Dates

March 1, 1999

Conference Location

Dusseldorf, GE

Conference Title

United Thermal Spray Conference

Pub Type

Conferences

Keywords

microstructure, plasma-sprayed deposits, small-angle scattering, thermal barrier coatings

Citation

Allen, A. , Ilavsky, J. , Long, G. , Wallace, J. , Berndt, C. and Herman, H. (1999), Microstructural Changes in YSZ Deposits During Annealing, Procedings of United Thermal Spray Conference '99 (UTSC '99), Dusseldorf, GE (Accessed April 19, 2024)