Woicik, J.
(1999),
Bond Lengths in Strained Semiconductor Alloys, Journal of Synchrotron Radiation
(Accessed May 11, 2025)
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Bond Lengths in Strained Semiconductor Alloys
Published
Author(s)
Abstract
The bond lengths in a series of strained, buried Ga1-xInxAs thin-alloy films grown coherently on GaAs(001) and InP(001) substrates have been determined by high-resolution extended x-ray absorption fine-structure and diffraction anomalous fine-structure measurements. Comparisons with random-cluster, valence-force field calculations demonstrate that the external in-plane epitaxial strain imposed by pseudomorphic growth opposes the natural bond-length distortions due to alloying.Citation
Journal of Synchrotron Radiation
Volume
6
Issue
Part 3
Pub Type
Journals
Keywords
DAFS, diffraction anamolous-fine structure, EXAFS, extended x-ray absorption-fine structure
Citation
Issues
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Created May 1, 1999, Updated February 19, 2017