U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Journals

A Simulation Study of Repeatability and Bias in the CD-SEM

Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
Abstract: The ability of a critical dimension scanning electron microscope (CD-SEM) to resolve differences in the widths of two lines depends on the instrument...

Dynamic Model: Concerts and Usage Rules

Author(s)
Leonard J. Gallagher
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

Economic Value of Combined Best Practice Use

Author(s)
S H. Lee, Stephen R. Thomas, C L. Macken, Robert E. Chapman, R L. Tucker, I H. Kim
This paper measures the value of best practices based on data taken from the Construction Industry Institute Benchmarking and Metrics database. A three-step...

Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry Interlaboratory Comparison of Mixtures of Polystyrene With Different End Groups: Statistical Analysis of Mass Fractions and Mass Moments

Author(s)
Charles M. Guttman, S Wetzel, Kathleen M. Flynn, B M. Fanconi, David L. VanderHart, William E. Wallace
A matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF MS) interlaboratory comparison was conducted on mixtures of synthetic...

On the Growth and Form of Spherulites

Author(s)
L Granasy, T Pusztai, G -. Tegze, James A. Warren, Jack F. Douglas
Many structural materials (metal alloys, polymers, minerals, etc.) are formed by quenching liquids to form crystalline solids. This highly non-equilibrium...

Device and Technology Evolution for Si-Based RF Integrated Circuits

Author(s)
Herbert S. Bennett, Ralf Brederlow, Julio Costa, Peter Cottrell, Margaret Huang, Anthony A. Immorlica, Jan-Erik Mueller, Marco Racanelli, Hisashi Shichijo, Charles E. Weitzel, Bin Zhao
The relationships between device feature size and device performance figures of merit (FoMs) are more complex for RF applications than for digital applications...

Road Sign Detection and Recognition

Author(s)
Michael O. Shneier
Road sign detection is important to a robotic vehicle that automatically drives on roads. In this paper, road signs are detected by means of rules that restrict...

Low Jitter Metal Vapor Vacuum Arc Ion Source for EBIT Injections

Author(s)
G Holland, Craig N. Boyer, J Seely, Joseph N. Tan, Joshua M. Pomeroy, John D. Gillaspy
A metal vapor vacuum arc (MeVVA) ion source having eight different cathodes that are individually selectable via the control electronics and having low trigger...
Was this page helpful?