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PUBLICATIONS

A Tensile-Testing Technique for Micrometer-Sized Free-Standing Thin Films

Published

Author(s)

Yi-Wen Cheng, David T. Read, Joseph D. McColskey, J Wright
Citation
Thin Solid Films
Volume
484
Issue
No. 1-2
Pub Type
Journals

Download Paper

Local Download

Keywords

micrometer-sized specimen, microstensile test, stress-strain curve, tensile properties

Citation

Cheng, Y. , Read, D. , McColskey, J. and Wright, J. (2005), A Tensile-Testing Technique for Micrometer-Sized Free-Standing Thin Films, Thin Solid Films, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851350 (Accessed March 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 2005, Updated February 17, 2017