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Conferences

Acceleration and Parallelization of ZENO/Walk-on-Spheres

Author(s)
Derek Juba, Walid Keyrouz, Michael V. Mascagni, Mary C. Brady, Michael Mascagni
This paper describes our on-going work to accelerate ZENO, a software tool based on Monte Carlo methods (MCMs), used for computing material properties at the...

DNA Damage and Repair in Cancer

Author(s)
M Miral Dizdar
Oxygen- and nitrogen-derived reactive species are constantly generated in living organisms by endogenous and exogenous sources. Reactions of reactive species...

STANDARD REFERENCE MATERIALS FOR THE POLYMERS INDUSTRY

Author(s)
Walter G. McDonough, Sara Orski, Charles M. Guttman, Kalman Migler, Kathryn L. Beers
The National Institute of Standards and Technology (NIST) provides science, industry, and government with a central source of well-characterized materials...

Near-field microwave microscopy of one-dimensional nanostructures

Author(s)
Samuel Berweger, Paul T. Blanchard, Rebecca C. Quardokus, Frank W. DelRio, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Sergiy Krylyuk, Albert Davydov
With the ability to measure sample conductivity with nanometer spatial resolution, scanning microwave microscopy (SMM) is a powerful tool to study nanoscale...

The New SURF Beamline 3

Author(s)
Robert E. Vest
A new beamline is being commissioned at the Synchrotron Ultraviolet Radiation Facility (SURF III) on the Gaithersburg, MD campus of the National Institute of...

Antenna Metrology 100-500 GHz: A New Approach

Author(s)
Perry F. Wilson, Joshua A. Gordon, David R. Novotny, Jeffrey R. Guerrieri
A typical near-field scanning range for antenna measurements is based on simple translation stages (planar) or stacked rotators (spherical), or both...
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