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Conferences

Josephson-Based Full Digital Bridge for High-Accuracy Impedance Comparisons

Author(s)
Frederic Overney, Nathan Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna Fox, Jason Underwood, Andrew D. Koffman, Samuel P. Benz
This paper describes a Josephson-based impedance bridge capable of comparing any types of impedance over a large bandwidth. The heart of the bridge is a dual AC...

Laser Refractometer as a Transfer Standard of the Pascal

Author(s)
Patrick Egan, Jack A. Stone Jr., Jacob Edmond Ricker, Jay H. Hendricks
We have developed a new low pressure sensor which is based on the measurement of (nitrogen) gas refractivity inside a Fabry-Perot (FP) cavity. We compare...

Pros and Cons of Egress Drills

Author(s)
Steve Gwynne, Karen E. Boyce, Erica D. Kuligowski, Daniel Nilsson, Amanda Robbins, Ruggiero Lovreglio
This article explores how egress drills are currently employed, their impact, and the insights gained from them. By investigating their strengths and...

Methodology for Increasing Image Feature Measurement Accuracy

Author(s)
Michael Paul Majurski, Joe Chalfoun, Steven Lund, Peter Bajcsy, Mary C. Brady
Motivation Image features are computed in cell biology to derive quantitative information regarding cell state, differentiation, biological activity, and cell...

Powder Bed Layer Geometry

Author(s)
Michael L. McGlauflin, Shawn P. Moylan
This paper investigates the measurement of machine performance errors associated with the powder bed geometry of a commercially available laser additive...

Automating Asset Knowledge with MTConnect

Author(s)
John L. Michaloski, Frederick M. Proctor, Sid Venkatesh, Sidney Ly, Martin Manning
In order to maximize assets, manufacturers should use real-time knowledge garnered from ongoing and continuous collection and evaluation of factory-floor...

Variability of Sounder Measurements in Manufacturing Facilities

Author(s)
Jeanne Quimby, Alexandra Curtin, David R. Novotny, Chih-Ming Wang, Rick Candell
Uncertainties in the linear regression fit of Path Loss are derived from variability in position. These uncertainties are used to determine the required...

Process improvements in the production of silicon immersion gratings

Author(s)
Cynthia Brooks, Benjamin Kidder, Michelle Grigas, Daniel Jaffe, Ulf Griesmann, Daniel Wilson, Richard Muller
We have explored a number of lithographic techniques and improvements to produce the resist lines that then define the grating groove edges of silicon immersion...

Summary of the 2015 NIST Language Recognition i-Vector Machine Learning Challenge

Author(s)
Audrey N. Tong, Craig S. Greenberg, Alvin F. Martin, Desire Banse, John M. Howard, G R. Doddington, Danilo B. Romero, Douglas A. Reynolds, Lisa Mason, Tina Kohler, Jaime Hernandez-Cordero, Elliot Singer, Alan McCree, Lisa Mason
In 2015 NIST coordinated the first language recognition evaluation (LRE) that used i-vectors as input, with the goals of attracting researchers outside of the...

An Long Term Evolution (LTE) Device-to-Device module for ns-3

Author(s)
Richard A. Rouil, Fernando Cintron, Aziza Ben Mosbah, Samantha Gamboa Quintiliani
In this paper, we provide an overview of the on-going implementation of a 3rd Generation Partnership Program (3GPP) Proximity Services (ProSe) module in ns-3 to...
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