Williams, D.
, Chamberlin, R.
, Zhao, W.
, Cheron, J.
and Miguel, U.
(2016),
Verification of a Foundry-Developed Transistor Model with Measurement Uncertainty, International Microwave Symposium, San Francisco, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919866
(Accessed October 11, 2024)
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Verification of a Foundry-Developed Transistor Model with Measurement Uncertainty
Published
Author(s)
, , Wei Zhao, , Urteaga Miguel
Abstract
We verify a foundry model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the verification process, and use them to quantify the differences we observe in the measurements and models.Proceedings Title
International Microwave Symposium
Conference Dates
May 22-27, 2016
Conference Location
San Francisco, CA, US
Pub Type
Conferences
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Created May 26, 2016, Updated April 19, 2022