Published: May 27, 2016
Dylan F. Williams, Richard A. Chamberlin, Wei Zhao, Jerome G. Cheron, Urteaga Miguel
We verify a foundry model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the verification process, and use them to quantify the differences we observe in the measurements and models.
Proceedings Title: International Microwave Symposium
Conference Dates: May 22-27, 2016
Conference Location: San Francisco, CA
Pub Type: Conferences
Created May 27, 2016, Updated March 19, 2019