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Conferences

Char Enhancing Approaches to Flame Retarding Polymers

February 1, 1998

Author(s)

Jeffrey W. Gilman, Takashi Kashiwagi, Richard H. Harris Jr., S M. Lomakin, J D. Lichtenhan, A. Bolf, P. Jones

Additives that increase the amount of charcoal-like residue or carbonaceous char that forms during polymer combustion are very effective fire retardants (FR)...

Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals

February 1, 1998

Author(s)

Albert J. Fahey

Anomalies in Shallow Depth Profiles of Boron in Silicon

February 1, 1998

Author(s)

P Chi

Growth and Analysis of Near Ideal Thin Films and Multilayers

February 1, 1998

Author(s)

S M. Owens, R Deslattes, J Pedulla

As thin film technology moves into the truly nano-scale region [

Performing Measurement of Surface Structures With the Calibrated Atomic Force Microscope

February 1, 1998

Author(s)

R Koning

The use of the atomic force microscope (AFM) to characterize surface structures for industrial applications is rapidly increasing. To compare the results...

Interlaboratory Comparison of Polarization Crosstalk Measurement Methods in Terminated High-Birefringence Optical Fiber

February 1, 1998

Author(s)

Rex M. Craig

Long Term Stability in a Calibrated Time-Domain Network Analyzer

February 1, 1998

Author(s)

Donald C. DeGroot, Jeffrey Jargon

Implementing Assertions for Object-Oriented Systems

January 30, 1998

Author(s)

D Wallace, M Schmid, M Schatz, J Voas

The state-of-the-art in software testing is continually evolving. Researchers and practitioners are inventing techniques that improve the efficiency of software...

Acoustically Steered and Rotated (ASTRO) Optoelectronic 2-D True Time Delay Generation

January 25, 1998

Author(s)

E G. Paek, Joon Y. Choe, Tae K. Oh

The phased array antenna is an important technology for future wireless communications. True time delay methods as opposed to phase-shifting method) allow...

Dynamical Diffraction and X-Ray Standing Waves from 2-Fold Reflections in the Quasicrystal AlPdMn

January 15, 1998

Author(s)

Terrence J. Jach, S. M. Thurgate, Y. Zhang, R. Colella, A. I. Goldman, S. Kycia, M. De Boissieu, M. Boudard

Caltrans Specifications. Appendix 3.1B.

January 7, 1998

Author(s)

. Caltrans

Application of Composites in California Bridges Quality Control Specifications and Testing Program.

January 7, 1998

Author(s)

J E. Roberts

3 of Electronic Devices

January 1, 1998

Author(s)

Hans Engler, T. M. Souders, Gerard N. Stenbakken

Testing Displacement-Measuring Interferometer Systems

January 1, 1998

Author(s)

Jack A. Stone Jr., Martin Schroeck, Michael T. Stocker

We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates...

Measurements of Formaldehyde Concentrations and Formation Rates in a Methane-Air, Non-Premixed Flame and Their Implications for Heat-Release Rate

January 1, 1998

Author(s)

M. P. Tolocka, J. H. Miller

The Open Assembly Design Environment Project: An Architecture for Design Agent Interoperability

January 1, 1998

Author(s)

Steven Shooter, Walid Keirouz, Peter F. Hart, Kevin W. Lyons

The Open Assembly Design Environment (OpenADE)project is an initiative at the National Institute of Standards and Technology (NIST) to provide an integrated and...

Synthesis and Characterization of Fe-Co Alloy Nanoparticles

January 1, 1998

Author(s)

John H. Scott

Study of the Gas Jet in a Close-Coupled Gas-Metal Atomizer

January 1, 1998

Author(s)

Pedro I. Espina, U Piomelli

Voltage Modulation Scanned Probe Oxidation (Abstract)

January 1, 1998

Author(s)

John A. Dagata, T Inoue, J Itoh, K Matsumoto, H Yokoyama

This talk describes methods for enhancing the growth rate and electrical characteristics of nanostructures produced on silicon and titanium substrates by...

Measurements of Pitch, Height, and Width Artifacts with the NIST Calibrated Atomic Force Microscope

January 1, 1998

Author(s)

Ronald G. Dixson, V W. Tsai, Theodore V. Vorburger, Edwin R. Williams, X Wang, Joseph Fu, R Koning

The presence of the atomic force microscope (AFM) in the industrial metrology setting is rapidly increasing. Properties commonly measured in such applications...

The Study of Silicon Stepped Surfaces as Atomic Force Microscope Calibration Standards With a Calibrated AFM at NIST

January 1, 1998

Author(s)

V W. Tsai, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, R Koning, Richard M. Silver, E. C. Williams

Due to the limitations of modern manufacturing technology, there is no commercial height artifact at the sub-nanometer scale currently available. The single...

NIST Microform Calibration - How It Benefits U.S. Industry

January 1, 1998

Author(s)

Jun-Feng Song, Theodore V. Vorburger

In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles...

Extinction Coefficients for Dielectric and Conducting Doublets of Spheres

January 1, 1998

Author(s)

Egon Marx

The extinction cross-sections of doublets of polystyrene and carbon spheres are determined using the optical theorem. The forward scattering amplitude is...

The Proposed Smart Transducer Interface Standard

January 1, 1998

Author(s)

Kang B. Lee

A proposed smart transducer interface standard, P1451 is being developed by TC9, Technical Committee on Sensor Technology, of the Instrumentation and...

The Molecular Measuring Machine

January 1, 1998

Author(s)

John A. Kramar, E Gilsinn, E Amatucci, C Villarrubia, E C. Teague, W Scire, William B. Penzes

To help meet the measurement needs of industries preparing to manufacture future generations of nanoelectronic devices and circuits, the National Institute of...

Advances in NIST Standard Rockwell Diamond Indenters

January 1, 1998

Author(s)

Jun-Feng Song, Samuel R. Low III, David J. Pitchure, Theodore V. Vorburger

Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness...

Measurement Traceability of NIST Standard Rockwell Diamond Indenters

January 1, 1998

Author(s)

Jun-Feng Song, Samuel R. Low III, Walter S. Liggett Jr, David J. Pitchure, Theodore V. Vorburger

A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and...

Ultrasensitive detections of weak resonances Application to optical frequency standards

January 1, 1998

Author(s)

Jun Ye, L -. Ma, John L. Hall

Optical frequency standards: Progress and applications

January 1, 1998

Author(s)

John L. Hall, Jun Ye, L -. Ma, K R. Vogel, Tim P. Dinneen

GPS Week Roll-Over and YK Compliance for NBS-Type Receivers, and Absolute Calibration of the NIST Primary Receiver

January 1, 1998

Author(s)

Victor S. Zhang, Marc A. Weiss, E Powers, R Loiler

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