Fahey, A.
(1998),
Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals, Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry , Orlando, FL
(Accessed April 26, 2024)
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Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals
Published
Author(s)
Proceedings Title
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry
Conference Dates
September 7-12, 1997
Conference Location
Orlando, FL
Conference Title
11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI)
Pub Type
Conferences
Citation
Created February 1, 1998, Updated February 19, 2017