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Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals

Published

Author(s)

Albert J. Fahey
Proceedings Title
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry
Conference Dates
September 7-12, 1997
Conference Location
Orlando, FL
Conference Title
11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI)

Citation

Fahey, A. (1998), Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals, Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry , Orlando, FL (Accessed March 1, 2024)
Created February 1, 1998, Updated February 19, 2017