Fahey, A.
(1998),
Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals, Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry , Orlando, FL
(Accessed January 24, 2025)
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Measurement of REE Abundances in NIST SERM-600 Series Glasses and Direct Measurements of REE Oxide Ion Signals
Published
Author(s)
Proceedings Title
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry
Conference Dates
September 7-12, 1997
Conference Location
Orlando, FL
Conference Title
11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI)
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 1, 1998, Updated February 19, 2017