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Growth and Analysis of Near Ideal Thin Films and Multilayers

Published

Author(s)

S M. Owens, R Deslattes, J Pedulla

Abstract

As thin film technology moves into the truly nano-scale region [
Proceedings Title
Fifth Annual Sigma Xi Postdoctoral Poster Presentation
Conference Dates
February 18-19, 1998
Conference Title
Sigma Xi Web Page

Keywords

grazing incidence x-ray scattering GIXS, thin film technology

Citation

Owens, S. , Deslattes, R. and Pedulla, J. (1998), Growth and Analysis of Near Ideal Thin Films and Multilayers, Fifth Annual Sigma Xi Postdoctoral Poster Presentation (Accessed May 27, 2024)

Issues

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Created February 1, 1998, Updated February 17, 2017