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Growth and Analysis of Near Ideal Thin Films and Multilayers

Published

Author(s)

S M. Owens, R Deslattes, J Pedulla

Abstract

As thin film technology moves into the truly nano-scale region [
Proceedings Title
Fifth Annual Sigma Xi Postdoctoral Poster Presentation
Conference Dates
February 18-19, 1998
Conference Title
Sigma Xi Web Page

Keywords

grazing incidence x-ray scattering GIXS, thin film technology

Citation

Owens, S. , Deslattes, R. and Pedulla, J. (1998), Growth and Analysis of Near Ideal Thin Films and Multilayers, Fifth Annual Sigma Xi Postdoctoral Poster Presentation (Accessed April 19, 2024)
Created February 1, 1998, Updated February 17, 2017