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Growth and Analysis of Near Ideal Thin Films and Multilayers
Published
Author(s)
S M. Owens, R Deslattes, J Pedulla
Abstract
As thin film technology moves into the truly nano-scale region [
Proceedings Title
Fifth Annual Sigma Xi Postdoctoral Poster Presentation
Conference Dates
February 18-19, 1998
Conference Title
Sigma Xi Web Page
Pub Type
Conferences
Keywords
grazing incidence x-ray scattering GIXS, thin film technology
Citation
Owens, S.
, Deslattes, R.
and Pedulla, J.
(1998),
Growth and Analysis of Near Ideal Thin Films and Multilayers, Fifth Annual Sigma Xi Postdoctoral Poster Presentation
(Accessed December 2, 2023)