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Conferences

Measurements of relative phase and quantum beat note between Bose-Einstein condensates

January 1, 1998

Author(s)

D S. Hall, M R. Matthews, C E. Wieman, Eric A. Cornell

Preliminary Results from the NIST Cs Fountain Frequency Standard

January 1, 1998

Author(s)

D M. Meekhof, Steven R. Jefferts, D W. Lee, Craig Nelson

A New Computer Program for Predicting 1/f AM and PM Noise in Si BJT Amplifiers

January 1, 1998

Author(s)

J A. Li, Eva Ferre-Pikal, F L. Walls, D Forbes, S H. Talisa

Time Transfer Using the Phase of the GPS Carrier

January 1, 1998

Author(s)

K M. Larson, Judah Levine

CRL-NIST Joint Development of an Improved Optically Pumped Primary Frequency Standard

January 1, 1998

Author(s)

A Hasegawa, K Fukuda, N Kotake, M Kajita, T Morikawa, W D. Lee, Craig Nelson, D A. Jennings, L Mullen, Jon H. Shirley

Development of an Improved Optically Pumped Primary Frequency Standard

January 1, 1998

Author(s)

A Hasegawa, K Fukuda, N Kotake, M Kajita, D Morikawa, D Lee, Craig Nelson, D A. Jennings, L Mullen, Jon H. Shirley, Robert E. Drullinger

Voltage Adjustable Attenuation with Low 1/f Noise

January 1, 1998

Author(s)

Eva Ferre-Pikal, F L. Walls

Reducing the Effects of Local Oscillator Noise on the Frequency Stability of Cell-Based-Passive-Frequency Standards

January 1, 1998

Author(s)

J Q. Deng, A Demarchi, F L. Walls, Robert E. Drullinger

A Delay Calibration System for Two-Way Satellite Time and Frequency Transfer

January 1, 1998

Author(s)

F G. Ascarrunz, Steven R. Jefferts, Tom Parker

Uncertainty in calibrations for space research, commercial and other applications

January 1, 1998

Author(s)

R D. Mercer, E F. Zalewski, R W. Russell, S V. Burdick, Raju V. Datla

Stars as Radiometric Calibration Sources

January 1, 1998

Author(s)

R D. Mercer, R W. Russell, S V. Burdick, Raju V. Datla

Calibration Wafer for Temperature Measurement in RTP Tools

January 1, 1998

Author(s)

K G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen

Control of Condensed-phase Molecular Excitation with Intense Infrared and Visible Chirped Pulses

January 1, 1998

Author(s)

V D. Kleiman, Edwin J. Heilweil, D Mcmorrow, J S. Melinger

Sub-Picosecond Interfacial Electron Injection in Dye Sensitized Titanium Dioxide Films

January 1, 1998

Author(s)

T A. Heimer, Edwin J. Heilweil

Forbidden Line Wavelengths and Transition Probabilities Measured Using an Electron Beam Ion Trap (EBIT)

January 1, 1998

Author(s)

E Traebert, P Beiersdorfer, S B. Utter, John D. Gillaspy, F. G. Serpa

Optically Controlled Collisions of Biological Objects, ed. by D.L. Farkas, B.J. Tromberg and R.C. Leif

January 1, 1998

Author(s)

B J. Davies, M Mammen, Kristian Helmerson, Rani Kishore, S -. Choi, William D. Phillips, G M. Whitesides

Improving Step Height and Pitch Measurements Using the Calibrated Atomic Force Microscope

January 1, 1998

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, V W. Tsai, Theodore V. Vorburger

The most important industrial application of Atomic Force Microscopy (AFM) is probably the accurate measurement of geometrical dimensions of small surface

The DOE2000 Materials MicroCharacterization Collaboratory

January 1, 1998

Author(s)

E Voelkl, K Alexander, J Mabon, M O'Keefe, Michael T. Postek, M Wright, N J. Zaluzec

The Materials Microcharacterization Collaboratory (MMC) was created last year as a pilot project within the U.S. Department of Energy''s DOE2000 program. The