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Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
The successful development of a collaboratory for Telepresence Microscopy (TPM) provides an important new tool to promote technology transfer in the areas of
The SEMATECH advanced metrology advisory group (AMAG) recently issued a critical dimension (CD) scanning electron microscope (SEM) specification. One component
Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex
Scanning capacitance microscopy was used to image 1) boron dopant gradients in p-type silicon, and 2) identical boron dopant gradients in n-type silicon. The
Samuel Benz, Clark A. Hamilton, Charles J. Burroughs
Operating margins for biolar superconducting voltage waveform synthesizer were measured. Current ranges were determined for 101 equally spaced dc voltage steps
S Smith, I. A. Lindsay, Anthony Walton, Michael W. Cresswell, Loren W. Linholm, Richard A. Allen, M. Fallon, Alan Gundlach
The current flow in lightly doped mono-crystalline silicon structures designed for use as low cost secondary reference linewidth standards is investigated. It
Both (1+x^2)^(-n) and (sin x/x)^n functions are very close to the Gaussian distribution for large value of n. Based on these functions, two new algorithms are
Jeffrey W. Gilman, Richard H. Harris Jr., Douglas Hunter
New goals outlined by the U. S. Federal Aviation Administration (FAA) Advanced Fire-Safe Aircraft Materials Research Program enumerate an order-of-magnitude
Many thermoplastic materials in common use for a wide range of applications, including spacecraft, develop bubbles internally as they bum due to chemical
Many thermoplastic materials in common use for a wide range of applications, including spacecraft, develop bubbles internally as they bum due to chemical
We propose a framework for throughput and stability analysis of a Direct Sequence Code Division Multiple Access (DS-CDMA) network. Given chip rate, processing
Several national studies have examined the vulnerabilities and threats to the critical infrastructures upon which the United States depends for its national
Adopting concepts from statistical language modeling and rule-based transformations can lead to effective and efficient text-to-phone (TTP) functions. We
Brian R. Lawn, Yeon-Gil G. Jung, D H. Kim, S K. Lee, I M. Peterson
Contact damage modes in cyclic loading with spheres are investigated in several ceramics, principally silicon nitride but also some ceramics used for dental
Construction metrology standardization research currently focuses on terrestial applications. For space based applications, there is the potential for great
Application of a compliant, low modulus dielectric layer between the chip joints (C4) and the carrier can decrease the thermally induced bending and probability
F Rosa, Yong Zhou, Z M. Zhang, D P. DeWitt, Benjamin K. Tsai
A detailed analysis of the radiation environment in the lower chamber of the RTP test bed at the National Institute of Standard and Technology (NIST) is
Frank S. Biancaniello, Rodney D. Jiggetts, Richard E. Ricker, Stephen D. Ridder
High Nitrogen Stainless Steel (HNSS) can simultaneously have high strength (ultimate and yield), high hardness, high ductility, and outstanding corrosion
Particle growth in silane RF discharges and the incorporation of particles into hydrogenated-amorphous-silicon (a-Si: H) devices is described. Measurements of
The objective of this project is to study carbon monoxide (CO) and soot formation in laminar, inverse diffusion flames (IDFs). The IDF is used because it is a
The paper reviews the development of chlorofluorocarbon refrigerants, the implemented replacements of ozone-depleting fluids, other considered alternatives, and
It has been recognized that the current Department of Energy (DOE) dishwasher test procedure is inadequate in testing soil sensing dishwashers. As a result, DOE
This paper is a condensed version of two previous publications: NIST Technical Note 1426, by Long T. Phan and Emil Simiu; and ASCE Civil Engineering magazine
Advances in the use of the atomic force microscope (AFM) to characterize polymeric materials have recently been made. Phase imaging with the AFM has emerged as
Coaxial straight-wire resistors have been constructed with the purpose of improving comparisons between resistors, capacitors, and inductors in the audio