Randa, J.
, Wiatr, W.
and Billinger, R.
(1999),
Comparison of Methods for Adapter Characterization, Tech. Dig., IEEE MTT-S International Microwave Symposium, Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4428
(Accessed January 20, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Comparison of Methods for Adapter Characterization
Published
Author(s)
, Wojciech Wiatr,
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 13-19, 1999
Conference Location
Anaheim, CA
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1999, Updated October 12, 2021