Software to Optimize the Testing of Mixed-Signal Devices

Published

June 1, 1999

Author(s)

Gerard N. Stenbakken, Andrew D. Koffman, T. M. Souders

Abstract

New software is now available to help test and measurement engineers optimize the testing of complex electronic devices. Examples of products that are benefiting from this software range from A/D and D/A converters to multi-range precision instruments. The software uses the empirical linear prediction methods developed at the National Institute of Standards and Technology (NIST) to reduce the cost of calibrating precision instruments. These methods have been written in a widely available commercial mathematical language. An easy-to-use graphical interface has been added to the software that makes use of the methods much simpler. The software allows the development of a model, the selection of an optimal reduced set of test points, and the prediction of the behavior at a larger number of points, along with confidence intervals for the estimates. These approaches are primarily aimed at analog and mixed-signal devices. An example of the use of this software is presented.

Proceedings Title

Proc. 5th IEEE Intl. Mixed Signal Testing Workshop

Conference Dates

June 15-18, 1999

Conference Location

Whistler, 1, CA

Pub Type

Conferences

Download Paper

Local Download

Keywords

empirical, mixed-signal devices, model, software, testing strategies

Citation

Stenbakken, G. , Koffman, A. and Souders, T. (1999), Software to Optimize the Testing of Mixed-Signal Devices, Proc. 5th IEEE Intl. Mixed Signal Testing Workshop, Whistler, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=20755 (Accessed January 14, 2025)