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Conferences

Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration

June 1, 2000

Author(s)

Donald C. DeGroot, Paul D. Hale, M. Vanden Bossche, F. Verbeyst, Jan Verspecht

We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are

Role of Crack Formation in the Electric Fatigue Behavior of Ferroelectric PZT Ceramics

June 1, 2000

Author(s)

D C. Lupascu, J Nuffer, Jay S. Wallace, J Rodel

The electric fatigue behavior of a commercial lead zirconate titanate (PZT) was investigated by optical microscopy and instrumented Hertzian microindentation

Surface Morphology Variations in MALDI-TOF-Mass Spectrometry Samples Prepared by Various Techniques Examined by Scanning Electron Microscopy

June 1, 2000

Author(s)

William R. Blair, Charles M. Guttman, A A. Guiseppetti

Continuing interest at NIST (National Institute of Standards and Technology) in producing MALDI (Matrix Assisted Laser Desorption/Ionization) analyses with a

Estimating the Magnitude and Phase Response of a 50 GHz Sampling Oscilloscope Using the Nose-to-Nose Method

June 1, 2000

Author(s)

Paul D. Hale, Tracy S. Clement, Kevin Coakley, Chih-Ming Wang, Donald C. DeGroot, A. P. Verdoni

We describe estimation of the magnitude and phase response of a sampling oscilloscope over 50 Ghz bandwidth using the nose-to-nose method. The measurements are

A Phase-Field/Fluid Motion Model of Solidification: Investigation of Flow Effects During Directional Solidification and Dendritic Growth

June 1, 2000

Author(s)

D M. Anderson, William J. Boettinger, Geoffrey B. McFadden, A A. Wheeler

The phase-field model of diffusion-controlled solidification has recently been extended to include the effects of fluid flow in the melt. The phase-field model

Workshop on Evaluating Collaborative Enterprises - Workshop Report

June 1, 2000

Author(s)

Robert Allen, Amy Knutilla, Michelle P. Steves

The workshop, Evaluating Collaborative Engerprises, explored the issues surrounding the evaluation of collaborative systems including methods and tools for

Potentials of On-Line Scanning Electron Microscope Performance Analysis Using NIST Reference Material 8091

June 1, 2000

Author(s)

Michael T. Postek, Andras Vladar, Nien F. Zhang, Robert D. Larrabee

Fully automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that

Is a Production-Level Scanning Electron Microscope Linewidth Standard Possible?

June 1, 2000

Author(s)

Michael T. Postek, Andras Vladar, John S. Villarrubia

Metrology will remain a principal enabler for the development and manufacture of future generations of semiconductor devices. With the potential of 130 and l00

Thermal Modeling of Calorimeters for Excimer Lasers at 193 nm Wavelength

June 1, 2000

Author(s)

D X. Chen, Marla L. Dowell, Christopher L. Cromer, Nien F. Zhang

Narrow Photoluminescence Linewidths from Ensembles of Self-Assembled InGaAs Quantum Dots

June 1, 2000

Author(s)

Richard Mirin, Kevin L. Silverman, David H. Christensen

Self-assembled InGaAs quantum dots (QDs) have been intensely studied for the past several years because of the potential applications ranging from low threshold

Comparison of Electrical CD Measurements and Cross-Section Lattice-Plane Counts of Sub-Micrometer Features Replicated in (100) Silicon-on-Insulator Material

June 1, 2000

Author(s)

Michael W. Cresswell, John E. Bonevich, T J. Headley, Richard A. Allen, Lucille A. Giannuzzi, Sarah C. Everist, Rathindra Ghoshtagore, Patrick J. Shea

Test structures of the type known as cross-bridge resistors have been patterned in (100) epitaxial silicon material that was seeded on Bonded and Etched-Back

Effect of Resin Composition on the Remineralizing Ability of Amorphous Calcium Phosphate-Based Polymeric Composites

May 15, 2000

Author(s)

Drago Skrtic, Joseph M. Antonucci, E D. Eanes

Five photoactivated resins, designated BTHZ, TP, U0H, U66H and U132H, were evaluated for the effects of the chemical structure and compositional variations of

Information Technology for Engineering and Manufacturing

May 10, 2000

Author(s)

Michael Gruninger, Barbara L. Goldstein, Kevin G. Brady, Simon Szykman, Charles R. McLean, Joshua Lubell

Advances in information technology are frequently cited as the basis for the continued growth of the U.S. economy. Manufacturers use information technology

The NIST National Advanced Manufacturing Testbed: A Collaboratory for Manufacturing Research and Measurement Services

May 8, 2000

Author(s)

David C. Stieren

This paper describes the National Advanced Manufacturing Testbed (NAMT) at the National Institute of Standards and Technology (NIST). The NAMT is a distributed

Superconducting Transition Edge Sensor Bolometer Arrays for Submillimeter Astronomy

May 3, 2000

Author(s)

D. J. Benford, C. A. Allen, A. S. Kutyrev, S. H. Mosely, Rick A. Shafer, James A. Chervenak, Erich N. Grossman, Kent D. Irwin, John M. Martinis, Carl D. Reintsema

Studies of astrophysical emission in the far-infrared and submillimeter will increasingly require large arrays of detectors containing hundreds to thousands of

Performance Data on Cold Temperature Dispersion of CF3I

May 2, 2000

Author(s)

Jiann C. Yang, Thomas G. Cleary, Michelle K. Donnelly

Tritluoroiodomethane (CF3I) has been proposed as a potential replacement for Halon 1301 in aircraft engine nacelle and dry bay fire protection applications. The

Parallel Maximum-Likelihood Inversion for Estimating Wavenumber-Ordered Spectra in Emission Spectroscopy

May 2, 2000

Author(s)

H El-Sayed, M Salit, J Travis, J E. Devaney, William L. George

We introduce a parallelization of the maximum-likelihood cosine transform.This transform consists of a computationally intensive iterative fittingprocess, but

A Capacitance Standard Based on Counting Electrons: Progress Report

May 1, 2000

Author(s)

Mark W. Keller, Neil M. Zimmerman, Ali L. Eichenberger, John M. Martinis

We have built a prototype capacitance standard based on single-electron tunneling (SET) devices and a cryogenic vacuum-gap capacitor. We are currently involved

Effective Fragment Potentials and the Enzyme Active Site

May 1, 2000

Author(s)

S E. Worthington, Morris Krauss

Optimization of the binding conformation of a substrate in an enzyme active site using ab initio quantum chemistry methods are intractable since the active site

Fire Performance of High Strength Concrete: Research Needs

May 1, 2000

Author(s)

Long T. Phan, Nicholas J. Carino

A compilation of fire test data which shows distinct behaviroal differences between HSC and NSC at elevated temperature is presented. The differences are most

Report on the CCEM Comparison of 10 pF Capacitance Standards

May 1, 2000

Author(s)

Anne-Marie Jeffery

This paper describes the recent Comite Consultatif d'Electricite et Magnetisme (CCEM) comparison of 10 pF capacitors. The comparison of electrical standards

A Dual-Balance High-Resistance Bridge in the Range of 1 T{Ω} to 100 T{Ω}

May 1, 2000

Author(s)

Dean G. Jarrett

The NIST dual-balance guarded active-arm bridge, using a third dc source and a second detector to balance the guard network, is described. Improvements to the

Nonrandom Quantization Errors in Timebases

May 1, 2000

Author(s)

Gerard N. Stenbakken, D. Liu, J. A. Starzyk, Bryan C. Waltrip

Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the rms amplitude of

Ultra-Low Resistance Contacts to GaAs/AlGaAs Quantized Hall Resistors

May 1, 2000

Author(s)

Kevin C. Lee

Contacts to quantized Hall resistors (QHRs) must meet demanding specifications for contact resistance, reliability, ruggedness, and resistance to degradation. A

NIST 0.05-50 GHz Direct Comparison Power Calibration System

May 1, 2000

Author(s)

John R. Juroshek

Fatigue Model for Fiber-Reinforced Polymeric Composites in Civil Engineering Applications

May 1, 2000

Author(s)

Hai C. Tang, Tinh Nguyen, Joannie W. Chin, J Lesko, Tze J. Chuang

A fatigue model based on cumulative damage is developed for predicting the fatigue life of fiber-reinforced polymeric composites in offshore applications. This

A More Efficient Use of Δ-CRLs

May 1, 2000

Author(s)

David A. Cooper

Δ-Certificate revocation lists (delta-CRLs) were designed to provide a more efficient way to distribute certificate status information. However, as this paper

Thermally Induced Deformations in a Flip-Chip HDI Substrate

May 1, 2000

Author(s)

Elizabeth S. Drexler

At issue was the thermomechanical response of microvias in a high-density interconnect (HDI) substrate. The HDI package containing microvias, blind vias, solder

Experiments With Strontium in a Vapor Cell Magneto-Optic Trap

May 1, 2000

Author(s)

K R. Vogel, Tim P. Dinneen, Alan Gallagher, J L. Hall

In a ceramic vapor cell we have created a robust Sr magneto-optical trap that stores about 10 8 atoms with lifetimes > 200 ms. We eliminate the 5p 1P 1->4d 1 d2

Derivatization of Plastic Microfluidic Devices With Polyelectrolyte Multilayers

May 1, 2000

Author(s)

S L. Barker, Michael J. Tarlov, M L. Branham, J Xu, William A. MacCrehan, Michael Gaitan, Laurie E. Locascio

Microchannels fabricated in plastic materials by room temperature imprinting demonstrate large variability in surface charge as a result of the fabrication

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