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Arthur H. Fanney, Robert R. Zarr, J D. Ketay-Paprocki
This paper presents the results of a study aimed at quantifying the performance of water heaters insulated with polyurethane foams using three different blowing
The National Institute of Standards and Technology (NIST) is conducting a study to advance the science of measuring and modeling the optical scattering
Angela Davies, Christopher J. Evans, R Kestner, M Bremer
NIST's next generation interferometer (XCALIBIR) is a 300mm aperture, general-purpose interferometer designed to push the limits of optical testing. In this
J D. Barnes, R Kolb, K A. Barnes, A Nakatani, Boualem Hammouda
We propose to introduce Temperature-Induced Contrast Variation (TICV) as a technique for improving the specificity of microstructure analyses obtained using
Machine controllers built from standardized software parts, commonly referred to as components or modules, have the greatest potential to reap open architecture
Uwe Arz, Dylan F. Williams, Dave K. Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that
William P. Shackleford, Frederick M. Proctor, John L. Michaloski
To achieve efficient communication between distributed real-time processes, it is desirable to both choose the best protocol for each communication path and
Hui-Min Huang, James S. Albus, William P. Shackleford, Harry A. Scott, Thomas R. Kramer, Elena R. Messina, Frederick M. Proctor
This paper describes a reference architecture that is applicable to multiple classes of large-scale, complex real-time control systems. An associated tool
Due to the evolution of analysis & design requirements, the elaboration of formal specifications is becoming the bulk of new development environments. The
Ultra-small-angle X-ray scattering by dislocations in single-crystal aluminum has been observed in situ as a function of plastic deformation. The scattering is
We have studied the effects of interface morphology on the dynamics of dendritic growth. The Ivantsov solution for an isothermal paraboloid of revolution
We examine the stability of polarization switching in polyscrystalline ferroelectric/ferroelastic materials subject to continuous electromechanical loading. In
Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello
Demands for inexpensive fine metal powders for emerging P/M processing applications drive the need to maximize fine powder yields and improve the efficiency of
Frank S. Biancaniello, Rodney D. Jiggetts, Richard E. Ricker, Stephen D. Ridder, Mark R. Stoudt
The addition of nitrogen to stainless steels can dramatically improve properties. Using rapid solidification processing with its increased chemical homogeneity
Positive ionic energy distributions in modified very-high-frequency (MVHF) and radio frequency (RF) glow discharges were measured usinga retarding field
NIST is developing a web-based repository to serve as the core of a modular environment for developers of STEP, a family of product data exchange standards
The role of process simulation in microlithography is becoming an increasingly important part of process control as wafer feature sizes become smaller than the
Ronald G. Dixson, R Koning, Joseph Fu, Theodore V. Vorburger, Thomas B. Renegar
Atomic force microscopes (AFMs) generate three dimensional images with nanometer level resolution and, consequently, are used in the semiconductor industry as
John S. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell, Rathindra Ghoshtagore
The effect of the instrument on the measurement must be known in order to generate an accurate linewidth measurement. Although instrument models exist for a
The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical
Improved sample temperature measurement accuracy is demonstrated in a normal-incidence optical reflectance spectroscopy system that has been modified to allow
The National Institute of Standards and Technology (NIST) has recently administered two interlaboratory comparisons, coordinated within the Fiber Optics
Mark R. VanLandingham, John S. Villarrubia, G F. Meyers
Regardless of the type of test, reliable indentation measurements require knowledge of the shape of the indenter tip. For indentation measurements involving sub
We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped