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A Capacitance Standard Based on Counting Electrons: Progress Report

Published

Author(s)

Mark W. Keller, Neil M. Zimmerman, Ali L. Eichenberger, John M. Martinis

Abstract

We have built a prototype capacitance standard based on single-electron tunneling (SET) devices and a cryogenic vacuum-gap capacitor. We are currently involved in a thorough uncertainty analysis of the prototype, and we are preparing to make a direct comparison with the calculable capacitor at NIST.
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Volume
285
Issue
22
Conference Dates
May 14-19, 2000
Conference Location
Sydney

Keywords

capacitance standard, single-electron tunneling

Citation

Keller, M. , Zimmerman, N. , Eichenberger, A. and Martinis, J. (2000), A Capacitance Standard Based on Counting Electrons: Progress Report, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11945 (Accessed July 15, 2024)

Issues

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Created May 1, 2000, Updated January 27, 2020