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Conferences

The Challenge of Intelligent Systems

July 19, 2000

Author(s)

A Meystel, Elena R. Messina

This paper analyzes the meaning of intelligence within the domain of intelligent control. Because of historical reasons, there are varying and diverse...

Automated Parameter Extraction Software for Advanced IGBT Modeling

July 10, 2000

Author(s)

Allen R. Hefner Jr., Sebastien Bouche

A software package for extracting parameters used in advanced IGBT models is presented. In addition, new model equations and extraction procedures are...

Automated Part Tracking on the Construction Job Site

July 1, 2000

Author(s)

William C. Stone, L E. Pfeffer, K M. Furlani

Efforts are underway at the National Institute of Standards and Technology (NIST) to develop a web-based system for rapid tracking, identifying, and locating...

Performance of R-22 And Its Alternatives Working At High Outdoor Temperatures

July 1, 2000

Author(s)

S F. Yana Motta, Piotr A. Domanski

This paper examines the performance of R-22 and its possible replacements in an air-cooled air conditioner. The study focuses on the effect ofelevated outdoor...

Challenges in Developing Environmentally Safe Heat Pumping Systems

July 1, 2000

Author(s)

David Didion, J S. Brown

The advent of the global warming crisis has brought about a viewpoint, in many governments, that the halogen family of refrigerants should be replaced, in part...

Application of CW-CRDS to Monitor and Control Chemical Vapor Deposition

July 1, 2000

Author(s)

David S. Green, J P. Looney, G W. Rubloff

Continuous wave excitation cavity ring-down spectroscopy (CW-CRDS) is being evaluated for real time chemical sensing of volatile CVD byproducts (e.g. HF, H2O)...

Status of Microanalysis Standards at the National Institute of Standards and Technology (NIST)

July 1, 2000

Author(s)

Ryna B. Marinenko

This is a review of the current status of microanalysis standards at NIST -what is presently available, what will soon be available, and what might be available...

Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging

July 1, 2000

Author(s)

Scott A. Wight, John G. Gillen, G B. Saupe

A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope...

Cable-Based Reconfigurable Machines for Large Scale Manufacturing

July 1, 2000

Author(s)

Roger V. Bostelman, Adam S. Jacoff, Frederick M. Proctor, Thomas R. Kramer, Albert J. Wavering

Robot Crane, Robotics & Intelligent Systems, Control

An Open Architecture Inspection System

July 1, 2000

Author(s)

Elena R. Messina, Hui-Min Huang, Harry A. Scott

The benefits of open architectures are not currently available for most manufacturing equipment. We describe a testbed for experimenting with an open...

Keys to the Enhanced Performance of Mercuric Iodide Radiation Detectors Provided by Diffraction Imaging

July 1, 2000

Author(s)

B W. Steiner, L van den Berg, U Laor

High resolution monochomatic diffraction imaging is playing a central role in the optimization of novel high energy radiation detectors for superior energy...

Response Saturation of Polystyrene in MALDI

July 1, 2000

Author(s)

R J. Goldschmidt, Charles M. Guttman

For synthetic polymer samples, matrix-assisted laser desorption/ionization (MALDI) time-of-Flight (TOF) mass spectrometry (MS) can yield qualitative information...

Ultrafast Terahertz Spectroscopy: Measuring Low-Frequency Vibrational Modes of Hydrogen-Bonded Systems

July 1, 2000

Author(s)

D A. McWhorter, Alan L. Migdall, Edwin J. Heilweil

An ultrafast terahertz spectrometer using ZnTe crystals for optical rectification and free-space electro-optic sampling has been developed to measure...

Polarized Light-Scattering Measurements of Polished and Etched Steel Surfaces

July 1, 2000

Author(s)

Thomas A. Germer, T Rinder, HT Rothe

The directional dependence of the intensity and polarization of light scattered by a series of steel surfaces was measured. The samples differ by polishing...

In Situ Raman Spectroscopic Characterization of Compound Semiconductor Free Carrier Concentration

July 1, 2000

Author(s)

James E. Maslar, C Wang, D C. Oakley

Free carrier concentrations in compound semiconductors were determined using Raman spectroscopy. Spectra of selected films were recorded in situ in a chemical...

Improving the Accuracy of Particle Analysis

July 1, 2000

Author(s)

John A. Small, J R. Michael, Dale E. Newbury

Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe...

Debugging Agent Interactions: A Case Study

July 1, 2000

Author(s)

David W. Flater

The Contract Net protocol is a general-purpose protocol for distributed problem solving. Many modern agent infrastructures facilitate the generation of agents...

Testing for Imperfect Integration of Legacy Software Components

July 1, 2000

Author(s)

David W. Flater

In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are...

Modeling Requirements for Self-integrating Manufacturing Systems

July 1, 2000

Author(s)

Peter O. Denno

This paper discusses modeling requirements to support self-integrating manufacturing systems. Business process re-engineering, as it is currently performed, is...

Testing for Feasible Performance of a Distributed Manufacturing System: a Brief Experience Report

July 1, 2000

Author(s)

David W. Flater

NIST researchers conducted a series of informal performance tests to establish confidence that an existing manufacturing process control system could...

Specification of Interactions in Integrated Manufacturing Systems

July 1, 2000

Author(s)

David W. Flater

Systems of manufacturing software are often constructed by integrating pre-existing software components. Accurate specification of the component interactions in...

Proposed Bullet Signature Comparisons Using Autocorrelation Functions

July 1, 2000

Author(s)

Jun-Feng Song, Theodore V. Vorburger

The National Institute of Standards and Technology (NIST) standard bullets and casings are intended as reference standards for crime laboratories to help verify...

Representation of Heterogeneous Objects in ISO 10303 (STEP)

July 1, 2000

Author(s)

Lalit Patil, D Dutta, Amba D. Bhatt, Kevin K. Jurrens, Kevin W. Lyons, Mike Pratt, Ram D. Sriram

Solid modeling of objects forms an important task in design and manufacturing. Recent developments in the field of layered manufacturing have shown potential...

Performance of Precast Concrete Shear Walls

July 1, 2000

Author(s)

A E. Schultz, Geraldine Cheok, R A. Magana

An experimental program is undertaken to enhance the knowledge base regarding seismic design of precast concrete shear walls. The emulation design and jointed...

Semi-Active Control of Linear and Hysteretic Structures Using Variable Viscous and Magnetorheological Dampers

July 1, 2000

Author(s)

S El-Borgi, Michael A. Riley, Fahim H. Sadek, N Ayed

Numerous studies have been conducted so far on active or hybrid (active/passive) control of hysteretic structures using a wide range of linear and nonlinear...

Measurement Assurance Program for an Intercomparison of Josephson Voltage Standards between NIST and Lockheed Martin Astronautics

July 1, 2000

Author(s)

W. Wyatt Miller, Yi-hua D. Tang

An intercomparison of 10 V Josephson voltage standards (JVS) between NIST and Lockheed Martin Astronautics (LMA) using four travelling Zener standards will be...

Evaluation of Standards for a 10 V MAP Service at NIST

July 1, 2000

Author(s)

Yi-hua D. Tang, June E. Sims

A Measurement Assurance Program (MAP) provides a method of assessing and maintaining the quality of a measurement process. Such a program has two parts: the...

Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes

July 1, 2000

Author(s)

Nicholas Paulter, Donald R. Larson

Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and...

Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes

July 1, 2000

Author(s)

Donald R. Larson, Nicholas Paulter

We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature...

SIMnet: An Internet-Based Video Conferencing System Supporting Metrology

July 1, 2000

Author(s)

William E. Anderson, Nile M. Oldham, Mark E. Parker

SIMnet is a computer network implemented in 1999 to facilitate international comparisons, and foster collaborations between national metrology laboratories in...

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