Levine, L.
, Long, G.
and Thomson, R.
(2000),
In-Situ Observation of Small-Angle X-Ray Scattering by Dislocations, Small Angle Scattering, International Conference | 11th | Journal of Applied Crystallography | Mundsgaard International Publishers Ltd
(Accessed December 14, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
In-Situ Observation of Small-Angle X-Ray Scattering by Dislocations
Published
Author(s)
, , R Thomson
Abstract
Ultra-small-angle X-ray scattering by dislocations in single-crystal aluminum has been observed in situ as a function of plastic deformation. The scattering is observed to be strongly dependent upon sample orientation, with single dislocations, dislocation dipoles, and the features within dislocation walls each exhibiting distinct scattering profiles. Among the parameters that have been observed are correlations between dislocations, increasing dislocation content as a function of strain, and decreasing widths of the interface between the dislocation walls and the cell interiors with increasing deformation.Proceedings Title
Small Angle Scattering, International Conference | 11th | Journal of Applied Crystallography | Mundsgaard International Publishers Ltd
Volume
33
Issue
No. 1
Conference Dates
May 16-20, 1999
Conference Title
Journal of Applied Crystallography
Pub Type
Conferences
Keywords
dislocations, small-angle scattering, USAXS, x-ray scattering
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 2000, Updated February 19, 2017