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In-Situ Observation of Small-Angle X-Ray Scattering by Dislocations

Published

Author(s)

Lyle E. Levine, Gabrielle G. Long, R Thomson

Abstract

Ultra-small-angle X-ray scattering by dislocations in single-crystal aluminum has been observed in situ as a function of plastic deformation. The scattering is observed to be strongly dependent upon sample orientation, with single dislocations, dislocation dipoles, and the features within dislocation walls each exhibiting distinct scattering profiles. Among the parameters that have been observed are correlations between dislocations, increasing dislocation content as a function of strain, and decreasing widths of the interface between the dislocation walls and the cell interiors with increasing deformation.
Proceedings Title
Small Angle Scattering, International Conference | 11th | Journal of Applied Crystallography | Mundsgaard International Publishers Ltd
Volume
33
Issue
No. 1
Conference Dates
May 16-20, 1999
Conference Title
Journal of Applied Crystallography

Keywords

dislocations, small-angle scattering, USAXS, x-ray scattering

Citation

Levine, L. , Long, G. and Thomson, R. (2000), In-Situ Observation of Small-Angle X-Ray Scattering by Dislocations, Small Angle Scattering, International Conference | 11th | Journal of Applied Crystallography | Mundsgaard International Publishers Ltd (Accessed February 23, 2024)
Created June 1, 2000, Updated February 19, 2017