DeGroot, D.
, Hale, P.
, Vanden Bossche, M.
, Verbeyst, F.
and Verspecht, J.
(2000),
Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration, Tech Dig., Auto. RF Tech. Group Conf., Boston, MA, USA
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration
Published
Author(s)
, , M. Vanden Bossche, F. Verbeyst, Jan Verspecht
Abstract
We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are satisfied in this method and shows the interconnection errors are limited to measurement uncertainties of input reflection coefficients and adapter S-parameters utilized during the calibration procedure. Further, the input network model fully includes the effects of mismatch reflections, and we use the model to reconcile nose-to-nose waveform correction methods with traditional signal power measurement techniques.Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Conference Dates
June 15-16, 2000
Conference Location
Boston, MA, USA
Pub Type
Conferences
Keywords
broadband measuremnt, microwaves, nose-to-nose calibration, oscilloscope
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 2000, Updated October 12, 2021