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Conferences

Whisker Formation on Electroplated Sn-Cu

Author(s)
Maureen E. Williams, C E. Johnson, Kil-Won Moon, Gery R. Stafford, C A. Handwerker, William J. Boettinger
The probability of whisker growth on as-deposited tin (Sn) electrodeposits has been measured as a function of copper (Cu superscript2+) addition to a commercial

Martensitic Transformations in Constrained Films

Author(s)
Alexander L. Roytburd, Julia Slutsker
Polydomain micro- and nano-structures are natural products of phase transformations in solids. The trend to minimize the energy of internal long-range fields

Measurement of Residual Stress in Bent Pipelines

Author(s)
G A. Alers, Joseph D. McColskey
Buried gas and oil pipelines can be subjected to unexpected bending loads causedby such earth movements as earthquakes, wash-outs, road building, mining

Intrusion Detection with Mobile Agents

Author(s)
Wayne Jansen
Effective intrusion detection capability is an elusive goal, not solved easily or with a single mechanism. However, mobile software agents go a long way toward

Key Comparisons for Dummies: Lessons Learned

Author(s)
Dean G. Jarrett
This paper will discuss some of the challenges encountered during a recent key comparison. From these experiences, general lessons will be drawn that should

A 10T Mohm Per Step Hamon Transfer Standard

Author(s)
Dean G. Jarrett
To evaluate high resistance measurements and scaling in the range 1 Tohm to 100 Tohm, a 10 Tohm per step Hamon transfer standard is being developed. The design

Data-Assisted Design for Wind Loading

Author(s)
Emil Simiu, Fahim Sadek, T Whalen, S Jang, L L. Lu, S M. Diniz, A Grazini, Michael A. Riley
Current ASCE Standard provisions on wind loads for low-rise building design are based on wind tunnel tests conducted at the University of Western Ontario in the

CD Reference Materials for Sub-Tenth Micrometer Applications

Author(s)
Michael W. Cresswell, E. Hal Bogardus, Joaquin (. Martinez, Marylyn H. Bennett, Richard A. Allen, William F. Guthrie, Christine E. Murabito, B A. am Ende, Loren W. Linholm
Prototype linewidth reference materials with Critical Dimensions (CDs) as narrow as 70 nm have been patterned in (110) silicon-on-insulator films. The sidewalls

Modeling CPU Demand in Heterogeneous Active Networks

Author(s)
V Galtier, Kevin L. Mills, Y Carlinet
Active-network technology envisions deployment of virtual execution environments within network elements, such as switches and routers. As a result, application

The NIST Microforce Realization and Measurement Project

Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, Edwin R. Williams
The National Institute of Standards and Technology (NIST) has launched a five-year Microforce Realization and Measurement project focusing on the development of
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