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Conferences

Settling Times of High-Value Standard Resistors

Author(s)
Dean G. Jarrett, Randolph Elmquist
An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and

Digital Forensics - Using Perl to Harvest Hash Sets

Author(s)
Douglas R. White, John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and

Digital Forensics ¿ Using Perl to Harvest Hash Sets

Author(s)
Douglas R. White, John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and

Cryogenic Transfer Line Chilldown

Author(s)
N T. Van Dresar, James D. Siegwarth
The transient behavior of a small-scale cryogenic transfer line was investigated during chilldown to cryogenic temperatures. The vacuum-jacketed apparatus

Reference Metrology Using a Next Generation CD-AFM

Author(s)
Ronald G. Dixson, Angela Guerry
International SEMATECH (ISMT and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of AFM dimensional

Evaluation of New In-Chip and Arrayed Line Overlay Target Designs

Author(s)
M P. Davidson, M R. Bishop, Robert D. Larrabee, Michael T. Stocker, Jay S. Jun, Egon Marx, Richard M. Silver, Ravikiran Attota
Two types of overlay targets have been designed and evaluated for the study of optical overlay metrology. They are in-chip and arrayed overlay targets. In-chip

Precision tests of femtosecond laser optical frequency synthesizers

Author(s)
Long-Sheng Ma, Lennart Robertsson, Massimo Zucco, Zhiyi Bi, Robert Windeler, A Bartels, G Wilpers, Christopher W. Oates, Leo W. Hollberg, Scott Diddams
We compare the accuracy of femtosecond laser optical frequency synthesizers that employ microstructured fibers with those that directly generate a broadband

Absolute frequency measurements with a stabilized near-infrared optical frequency comb from a Cr:forsterite laser

Author(s)
Kristan L. Corwin, I Thomann, Tasshi Dennis, R W. Fox, William C. Swann, E. A. Curtis, C. W. Oates, G Wilpers, A Bartels, Sarah L. Gilbert, Leo W. Hollberg, Scott Diddams, Nathan R. Newbury, Jeffrey W. Nicholson, M. Yan
A Cr:forsterite laser-based frequency comb is stabilized simultaneously to two NIST frequency references. Methane lines from 1315 nm - 1330 nm are measured with

Cavity ring-down spectroscopy of semiconductor quantum dots

Author(s)
Joseph J. Berry, Todd E. Harvey, Richard Mirin, A Marian, Jun Ye
We employ cavity ringdown to perform absorption experiments of InGaAs/GaAs QDs. Integrating an AlAs/GaAs DBR incorporating InGaAs QD?s into a Fabry-Perot cavity
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