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The Optimization of MALDI-TOF-MS for Synthetic Polymer Characterization by Factorial Design

Published

Author(s)

S Wetzel, Charles M. Guttman, Kathleen M. Flynn, James J. Filliben

Abstract

One of the most significant issues in any analytical practice is optimization. Optimization and calibration are key factors in quantitation. In matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOFMS), one of the limitations restricting quantitation is instrument optimization. Understanding of which parameters are most influential and the effects of these parameters on the mass spectrum is required for optimization. This understanding is especially important when characterizing synthetic polymers by MALDI-TOF-MS, due to the complex nature of synthetic polymers. A first look at the data reveals that the most influential instrument parameters on the signal-to-noise detector voltage and the time length of delayed extraction. Laser energy, extraction voltage and lens voltage change slightly of the range of values considered, but their effects are small relative to the detector voltage and the delay length.
Proceedings Title
ASMS Conference on Mass Spectrometry and Allied Topics | 52nd | Proceedings of the 52nd ASMS Conference on Mass Spectrometry and Allied Topics | American Society for Mass Spectrometry (ASMS)
Conference Dates
May 23-27, 2005
Conference Location
Undefined
Conference Title
ASMS Conference on Mass Spectrometry

Keywords

factorial design, optimization, polymer mass spectrometry

Citation

Wetzel, S. , Guttman, C. , Flynn, K. and Filliben, J. (2004), The Optimization of MALDI-TOF-MS for Synthetic Polymer Characterization by Factorial Design, ASMS Conference on Mass Spectrometry and Allied Topics | 52nd | Proceedings of the 52nd ASMS Conference on Mass Spectrometry and Allied Topics | American Society for Mass Spectrometry (ASMS), Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852360 (Accessed May 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 22, 2004, Updated October 12, 2021