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Absolute frequency measurements with a stabilized near-infrared optical frequency comb from a Cr:forsterite laser

Published

Author(s)

Kristan L. Corwin, I Thomann, Tasshi Dennis, R W. Fox, William C. Swann, E. A. Curtis, C. W. Oates, G Wilpers, A Bartels, Sarah L. Gilbert, Leo W. Hollberg, Scott Diddams, Nathan R. Newbury, Jeffrey W. Nicholson, M. Yan

Abstract

A Cr:forsterite laser-based frequency comb is stabilized simultaneously to two NIST frequency references. Methane lines from 1315 nm - 1330 nm are measured with ±2.3 MHz uncertainty. The pressure shifts are also evaluated.
Conference Dates
May 16-21, 2004
Conference Location
San Francisco, CA, USA
Conference Title
Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO)

Keywords

infrared frequency comb, optical frequency comb, telecommunication wavelength standard

Citation

Corwin, K. , Thomann, I. , Dennis, T. , Fox, R. , Swann, W. , Curtis, E. , Oates, C. , Wilpers, G. , Bartels, A. , Gilbert, S. , Hollberg, L. , Diddams, S. , Newbury, N. , Nicholson, J. and Yan, M. (2004), Absolute frequency measurements with a stabilized near-infrared optical frequency comb from a Cr:forsterite laser, Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO), San Francisco, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31564 (Accessed April 16, 2024)
Created May 15, 2004, Updated October 12, 2021