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Direct Resistance Comparisons From the Qhr to 100 Megohm Using a Cryogenic Current Comparator

Published

Author(s)

Randolph Elmquist, Emmanouel S. Hourdakis, Dean G. Jarrett, Neil M. Zimmerman

Abstract

We describe the operation of a cryogenic current comparator (CCC) bridge that attains high current sensitivity while maintaining stability under a range of measurement conditions. Measurements of 100 M(Ohm) standard resistors and cryogenic thin-film resistors have been made at low voltage levels, based directly on a quantized Hall resistance (QHR) standard.
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

Cryogenic current comparator, Quantum Hall effect, Resistance measurements, Single electron transport

Citation

Elmquist, R. , Hourdakis, E. , Jarrett, D. and Zimmerman, N. (2004), Direct Resistance Comparisons From the Qhr to 100 Megohm Using a Cryogenic Current Comparator, Proc., Conference on Precision Electromagnetic Measurements (CPEM), London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31595 (Accessed November 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2004, Updated October 12, 2021