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E. J. Eklund, A Shkel, Svenja A. Knappe, Elizabeth A. Donley, John E. Kitching
This paper presents an application of micro glass blowing, in which multiple glass spheres are simultaneously shaped on top of a silicon wafer and subsequently
Svenja A. Knappe, Vladislav Gerginov, V Shah, Alan Brannon, Hugh Robinson, Leo W. Hollberg, John E. Kitching
We present measurements regarding the long-term stability of chip-scale atomic clock (CSAC) physics packages. The tight requirements for the temperature
Using phase-dispersion spectra measured with optical coherence tomography (OCT) in the frequency domain, we demonstrated the quantitative sizing of multiple
Shellee D. Dyer, Lara Roberson, Shelley M. Etzel, Tasshi Dennis, Andrew Dienstfrey, Vadim Tsvankin, Wei Tan
We present spectroscopic swept-source optical coherence tomography (OCT) measurements of the phase-dispersion of cell samples. We have previously demonstrated
Ian R. Coddington, Qudsia Quraishi, Luca Lorini, William C. Swann, J. C. Bergquist, C. W. Oates, Scott Diddams, Nathan R. Newbury
We demonstrate coherent transfer of optical signals with radian level noise (in a 25 MHz bandwidth) through a series of laser systems spanning from 657 nm to
J C. Ramella-Roman, Bruno Boulbry, Thomas A. Germer
Polarized light imaging has been used in the past for skin-cancer edge detection from skin lesions. In the standard imaging modality, the source, detector, and
The Department of Homeland Security, through the Science and Technology Directorate Standards Program, is developing performance standards for robots applied to
There are many commercial software security assurance tools that claim to detect and prevent vulnerabilities in application software. However, a closer look at
Ulf Griesmann, Quandou (. Wang, Marc Tricard, Paul Dumas, Christopher Hill
With the evolution of exposure tools for optical lithography towards larger numerical apertures, the semiconductor industry expects continued demand for
In order to increase the capacity of the NIST 10V Josephson Voltage Standard System for automatic calibration of Zener reference standards from the present 32
Richard M. Silver, Thomas A. Germer, Ravikiran Attota, Bryan M. Barnes, B Bunday, J Allgair, Egon Marx, Jay S. Jun
This paper is a comprehensive summary and analysis of a SEMATECH funded project to study the limits of optical critical dimension scatterometry. The project was
The National Institute of Standards and technology (NIST) plans to develop Standard Reference Material (SRM) 2809 Rockwell Diamond Indenter to support Rockwell
Laser trackers are now the tool of choice for large scale coordinate metrology. They are transportable allowing reconfigurable production facilities at a lower
We present a systematic study of the wetting behavior on the anisotropic microstructure having a simple sinusoidal profile. The micro-patterned surface was