Suehle, J.
, Xiong, H.
and Gurfinkel, M.
(2007),
Reliability and Characterization Challenges for Nano-Scale Electronic Devices, Nano and Giga Challenges in Electronics and Photonics, Phoenix, AZ, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32607
(Accessed October 17, 2025)
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Reliability and Characterization Challenges for Nano-Scale Electronic Devices
Published
Author(s)
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Abstract
Scaling electronic devices to nano-scale dimensions may introduce unforeseen physical mechanisms that may seriously compromise device reliability. It has been discussed that as individual atoms comprise a larger fraction of the actual device area, defects associated with atomic-level changes may dominate failure and drift mechanisms. Also, it is expected that failure distributions will become more dispersed as the activation energy for defect generation is not expressed as a single value but as a distribution of values.Proceedings Title
Nano and Giga Challenges in Electronics and Photonics
Conference Dates
March 14-16, 2007
Conference Location
Phoenix, AZ, USA
Pub Type
Conferences
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Keywords
Failure Mechanisms, Nanoelectronics, Reliability
Citation
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Created March 13, 2007, Updated October 12, 2021