@conference{778376,
  author = {John Suehle and Hao Xiong and Moshe Gurfinkel},
  title = {Reliability and Characterization Challenges for Nano-Scale Electronic Devices},
  year = {2007},
  month = {2007-03-14 00:03:00},
  publisher = {Nano and Giga Challenges in Electronics and Photonics, Phoenix, AZ, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32607},
  language = {en},
}