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Conferences

System identification approach applied to drift estimation

Author(s)
Tracy S. Clement, Frans Verbeyst, Rik Pintelon, Yves Rolain, Johan Schoukens
A system identification approach is applied to estimate the time base drift introduced by a high-frequency sampling oscilloscope. First, a new least squares

Metrics to Estimate Image Quality in Compressed Video Sequences

Author(s)
G O'Brien, S Israel, J Irvine, Charles D. Fenimore, John W. Roberts, Michelle Brennan, D Cannon, J Miller
A fundamental problem in image processing is to find objective metrics that parallel human perception of image quality. In this study, several metrics were

User-Oriented Evaluation of Compression for Motion Imagery

Author(s)
J Irvine, G O'Brien, J Miller, S Israel, Charles D. Fenimore, John W. Roberts, Michelle Brennan, Jeffrey Bartolucci, D Cannon
Motion imagery will play a critical role in future intelligence and military missions. The ability to provide a real time, dynamic view and persistent

Spectral decomposition of ultra-wide-band terahertz imagery

Author(s)
Erich N. Grossman, Charles Dietlein, Jonathan Chisum, A. Luukanen, J. E. Bjarnason, E. R. Brown
We investigate the spectral response of a THz imaging system based on ultrawideband cryogenic microbolometers. The bandwidth if this system, nominally 0.2 - 1.8

Broaband THz aqueous blackbody calibration source

Author(s)
Charles Dietlein, Zoya Popovic, Erich N. Grossman
We describe a broadband calibration source for the millimeter-wave to terahertz (THz) frequency range, the Aqueous Blackbody Calibration (ABC) source. The

Performance comparison of Nb and NbN antenna-coupled microbolometers

Author(s)
Charles Dietlein, A. Luukanen, J. S. Penttila, H. Sipola, L. Gronberg, H. Seppa, P. Helisto, Erich N. Grossman
We report the experimental results of a comparison between free-standing Nb and NbN microbolometer bridges coupled to equiangular spiral antennas on Si

TEM Calibration Methods for Critical Dimension Standards

Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, M R. Bishop, Michael W. Cresswell, J Allgair
One of the key challenges in critical dimension (CD) metrology is finding suitable calibration standards. Over the last few years there has been some interest
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