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Conferences

A Robot Ontology for Urban Search and Rescue

Author(s)
Craig I. Schlenoff, Elena R. Messina
The goal of this Robot Ontology effort is to develop and begin to populate a neutral knowledge representation (the data structures) capturing relevant

Spectroscopy of atomic and molecular ions using quantum logic

Author(s)
Piet Schmidt, Till P. Rosenband, Jeroen Koelemeij, David Hume, Wayne M. Itano, James C. Bergquist, David J. Wineland
Recently developed techniques for quantum computation using trapped ions allow unprecedented coherent control of the internal and external states of single

Entity Knowledge Model Supporting Intelligent Systems

Author(s)
Hui-Min Huang, James S. Albus, Elena R. Messina, Harry A. Scott, Maris Juberts
Intelligent systems operate in uncertain and complex environments. In order to achieve their goals, these systems require rich and updated knowledge about the

Quantum Key Distribution System Operating at Sifted-Key Rate over 4 Mbit/s

Author(s)
Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Hai Xu, Barry J. Hershman, Joshua Bienfang, David H. Su, Ronald Boisvert, Charles W. Clark, Carl J. Williams
A complete fiber-based polarization encoding quantum key distribution (QKD) system based on the BB84 protocol has been developed at National Institute of

Proposed Rapid Cooldown Technique for Pulse Tube Cryocoolers

Author(s)
Ray Radebaugh, Agnes O¿Gallagher, Michael A. Lewis, Peter E. Bradley
Some cryocooler applications, such as those for military operations dealing with high temperature superconducting (HTS) magnets, motors, or generators, require

When to Fuse Two Biometrics?

Author(s)
Elham Tabassi, Patrick J. Grother, George W. Quinn
Biometric fusion, acquisition and combination of multiple pieces of evidence of identity, can achieve higher accuracy of biometric recognition than using a

Uncertainties of Spectral Responsivity Measurements

Author(s)
George P. Eppeldauer, G Sauter, James Gardner
Uncertainty estimates of detector spectral responsivity measurements are discussed. A model describes independent (uncorrelated) uncertainty components at a

Reverse Noise Measurement and Use in Device Characterization

Author(s)
James P. Randa, Tom McKay, Susan L. Sweeney, Dave K. Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse

Display Measurements for Flat Panel Displays

Author(s)
Edward F. Kelley
In this tutorial, problems encountered in making common measurements on flat-panel displays are reviewed, equipment limitations are explored, and properly