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Conferences

Oxide Reliability of SiC MOS Devices

Author(s)
Liangchun (. Yu, Kin P. Cheung, Jason P. Campbell, John S. Suehle, Kuang Sheng
Silicon carbide possesses excellent material properties for high temperature, high frequency and high power applications. Among all the device structures...

Calibration of a Radiance Standard for the NPP/OMPS Instrument

Author(s)
Bettye C. Johnson, James J. Butler, Scott J. Janz, Robert D. Saunders, John W. Cooper, Matthew G. Kowalewski, R Barnes
In June 2007, a spherical integrating source was calibrated in the National Aeronautics and Space Administration(NASA) Goddard Space Flight Center’s (GSFC)...

Alpha-Dot or Not: Comparison of Two Single Atom Optical Clocks

Author(s)
Till P. Rosenband, David Hume, Chin-Wen Chou, J.C. Koelemeij, A. Brusch, Sarah Bickman, Windell Oskay, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Nathan R. Newbury, William C. Swann, Wayne M. Itano, David J. Wineland, James C. Bergquist
Repeated measurements of the frequency ratio of Hg + and Al + single-atom optical clocks over the course of a year yield a constraint on the possible temporal...

Chip-scale atomic devices: precision atomic instruments based on MEMS

Author(s)
John E. Kitching, Svenja A. Knappe, Vladislav Gerginov, Vishal Shah, Peter D. Schwindt, Brad Lindseth, Elizabeth A. Donley, Ying-ju Wang, Eleanor Hodby, Matt Eardley, Ricardo Jimenez Martinez, William C. Griffith, Andrew Geraci, Jan Preusser, Tara C. Liebisch, Hugh Robinson, Leo Hollberg
We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and...

NIST F1 and F2

Author(s)
Thomas P. Heavner, Tom Parker, Jon H. Shirley, Steven R. Jefferts
The National Institute of Standards and Technology operates a cesium fountain primary frequency standard, NIST-F1, which has been contributing to International...

CTOA Measurements of Welds in X100 Pipeline Steel

Author(s)
Elizabeth S. Drexler, Philippe P. Darcis, Christopher N. McCowan, John M. Treinen, Avigdor Shtechman, Roni Reuven, Thomas A. Siewert, Robert Smith, J. Merritt, Joseph D. McColskey
A suite of tests characterizing X100 pipeline steels was initiated at the National Institute of Standards and Technology (NIST) in Boulder. Part of the test...

Using uncalibrated lasers as wavelength standards

Author(s)
Jack A. Stone Jr.
The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary...

International comparisons of optical fiber power measurements

Author(s)
Igor Vayshenker, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We discuss the results of optical fiber power meter (OFPM) measurements at 1302 and 1546 nm made by NIST and six national measurement institutes (NMIs). We also...

f1' EVALUATION AND MEASUREMENT COMPARISON

Author(s)
Jiangen PAN, Haiping SHEN, Yuqin Zong, Yoshi Ohno
The mismatch of spectral responsivity to the CIE V(lambda) function, i. e., the f1' index, is the most critical characteristic of photometers and tristimulus...

The Iris Challenge Evaluation 2005

Author(s)
P J. Phillips, Kevin W. Bowyer, Patrick J. Flynn, Xiaomei Liu, W T. Scruggs
This paper describes the Iris Challenge Evaluation (ICE) 2005. The ICE 2005 contains a dataset of 2953 iris images from 132 subjects. The data is organized into...

An Application Framework for IEEE 1588 Standard

Author(s)
Yuyin Song, Kang B. Lee
This paper introduces an application framework for the Institute of Electrical and Electronics Engineers (IEEE) 1588 standard. This application framework...

Sensitivity of a Smoke Toxicity Test Method to Test Conditions

Author(s)
Nathan D. Marsh, Richard G. Gann, Jason D. Averill, Marc R. Nyden
Experiments have been conducted in the NFPA 269/ASTM E 1678 radiant apparatus to determine the sensitivity of toxic gas generation to atmospheric oxygen...
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